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Klaus-Dieter Steeg
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Kronau, DE
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Patents Grants
last 30 patents
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Patent Grant
Analysis system for analyzing a sample on an analytical test element
Patent number
7,808,645
Issue date
Oct 5, 2010
Roche Diagnostics Operations, Inc.
Jochen Schulat
G01 - MEASURING TESTING
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Patent Grant
Test strip analysis system
Patent number
5,424,035
Issue date
Jun 13, 1995
Boehringer Mannheim GmbH
Joachim Hones
G01 - MEASURING TESTING
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Patent Grant
Test strip evaluating instrument for multiple test strips
Patent number
5,143,694
Issue date
Sep 1, 1992
Boehringer Mannheim GmbH
Dieter Schafer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ANALYSIS SYSTEM FOR ANALYZING A SAMPLE ON AN ANALYTICAL TEST ELEMENT
Publication number
20080144022
Publication date
Jun 19, 2008
Jochen Schulat
G01 - MEASURING TESTING