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Klaus Edinger
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Laurel, MD, US
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Patents Grants
last 30 patents
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Patent Grant
Field effect transistor sensor
Patent number
7,335,942
Issue date
Feb 26, 2008
Universitaet Kassel
Klaus Edinger
G01 - MEASURING TESTING
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Patent Grant
Focused ion-beam fabrication of fiber probes for use in near field...
Patent number
6,633,711
Issue date
Oct 14, 2003
University of Maryland
Saeed Pilevar
G01 - MEASURING TESTING
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Patent Grant
High resolution scanning thermal probe and method of manufacturing...
Patent number
6,518,872
Issue date
Feb 11, 2003
University of Maryland
Klaus Edinger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Field effect transistor sensor
Publication number
20050062116
Publication date
Mar 24, 2005
Klaus Edinger
G01 - MEASURING TESTING