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Klaus Felgenhauer
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Lahntal, DE
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last 30 patents
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Patent Grant
Microscope with a multi-functional adjustment knob
Patent number
5,684,627
Issue date
Nov 4, 1997
Leica Mikroskopie und Systeme GmbH
Michael Ganser
G02 - OPTICS
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Patent Grant
Process and device for electronically monitoring the overload on el...
Patent number
5,602,708
Issue date
Feb 11, 1997
Leica Mikroskopie und Systeme GmbH
Klaus Felgenhauer
G01 - MEASURING TESTING