Klaus Gwosch

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Goettingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of and apparatus for spatially measuring nano-scale structures
- Patent number 11,255,791
- Issue date Feb 22, 2022
- MAX PLANCK GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN
- Stefan W. Hell
- G01 - MEASURING TESTING
Information Patent Grant
Method of high spatial resolution determining a position of a singu...
- Patent number 10,962,479
- Issue date Mar 30, 2021
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Francisco Balzarotti
- G01 - MEASURING TESTING
Information Patent Grant
Method of high spatial resolution determining a position of a singu...
- Patent number 10,908,089
- Issue date Feb 2, 2021
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Francisco Balzarotti
- G01 - MEASURING TESTING
Information Patent Grant
Method of high spatial resolution determining a position of a singu...
- Patent number 10,900,901
- Issue date Jan 26, 2021
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Francisco Balzarotti
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for spatially measuring nano-scale structures
- Patent number 10,794,829
- Issue date Oct 6, 2020
- MAX-PLACK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V.
- Stefan W. Hell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of and Apparatus for Spatially Measuring Nano-Scale Structures
- Publication number 20200393378
- Publication date Dec 17, 2020
- Max-Planck-Gesellschaft zur Foerderung dert Wissenschaften e.V.
- Stefan W. Hell
- G01 - MEASURING TESTING
Information Patent Application
Method of High Spatial Resolution Determining a Position of a Singu...
- Publication number 20190234879
- Publication date Aug 1, 2019
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Francisco Balzarotti
- G01 - MEASURING TESTING
Information Patent Application
Method of High Spatial Resolution Determining a Position of a Singu...
- Publication number 20190234882
- Publication date Aug 1, 2019
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Francisco Balzarotti
- G01 - MEASURING TESTING
Information Patent Application
Method of High Spatial Resolution Determining a Position of a Singu...
- Publication number 20190235220
- Publication date Aug 1, 2019
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Francisco Balzarotti
- G01 - MEASURING TESTING
Information Patent Application
Method of and Apparatus for Spatially Measuring Nano-Scale Structures
- Publication number 20180259458
- Publication date Sep 13, 2018
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Stefan W. Hell
- G01 - MEASURING TESTING