Klaus Hallmeyer

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Kahla, DE

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Patents Grantslast 30 patents

Information Patent Grant
Optical measurement arrangement and method for inclination measurement
- Patent number 6,504,608
- Issue date Jan 7, 2003
- Leica Microsystems Jena GmbH
- Klaus Hallmeyer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for acquiring a complete image of a surface of...
- Publication number 20050225632
- Publication date Oct 13, 2005
- Leica Microsystems Jena GmbH
- Thomas Iffland
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement arrangement and method for inclination measurement
- Publication number 20010006419
- Publication date Jul 5, 2001
- Klaus Hallmeyer
- G01 - MEASURING TESTING