Klaus Heberle

Person

Klaus, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Position determining sensor unit
- Patent number 10,564,005
- Issue date Feb 18, 2020
- TDK-MICRONAS GMBH
- Joerg Franke
- G01 - MEASURING TESTING
Information Patent Grant
Test matrix adapter device
- Patent number 10,436,817
- Issue date Oct 8, 2019
- TDK-MICRONAS GMBH
- Timo Kaufmann
- G01 - MEASURING TESTING
Information Patent Grant
Position determining unit
- Patent number 10,429,209
- Issue date Oct 1, 2019
- TDK-MICRONAS GMBH
- Joerg Franke
- G01 - MEASURING TESTING
Information Patent Grant
Contacting device
- Patent number 10,236,607
- Issue date Mar 19, 2019
- TDK-MICRONAS GMBH
- Timo Kaufmann
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
IC package
- Patent number 10,026,684
- Issue date Jul 17, 2018
- TDK-MICRONAS GMBH
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC package
- Patent number 9,893,005
- Issue date Feb 13, 2018
- TDK-MICRONAS GMBH
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact device system
- Patent number 9,780,470
- Issue date Oct 3, 2017
- TDK-MICRONAS GMBH
- Johannes Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Injection-molded circuit carrier
- Patent number 9,718,224
- Issue date Aug 1, 2017
- TDK-MICRONAS GMBH
- Joerg Franke
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Magnetic field measuring device
- Patent number 9,645,203
- Issue date May 9, 2017
- Micronas GmbH
- Timo Kaufmann
- G01 - MEASURING TESTING
Information Patent Grant
Integrated magnetic field sensor and method for a measurement of th...
- Patent number 9,647,144
- Issue date May 9, 2017
- Micronas GmbH
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring system
- Patent number 9,513,343
- Issue date Dec 6, 2016
- Micronas GmbH
- Klaus Heberle
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system
- Patent number 9,442,169
- Issue date Sep 13, 2016
- Micronas GmbH
- Klaus Heberle
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a distance and an integrated magnetic field...
- Patent number 8,878,524
- Issue date Nov 4, 2014
- Micronas GmbH
- Klaus Heberle
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit for controlling an electric motor
- Patent number 8,866,426
- Issue date Oct 21, 2014
- Micronas GmbH
- Jörg Franke
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Current sensor and method for detecting a currentless state
- Patent number 8,841,906
- Issue date Sep 23, 2014
- Micronas GmbH
- Klaus Heberle
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor chip and method for generating pulse edges, assigned...
- Patent number 8,680,847
- Issue date Mar 25, 2014
- Micronas GmbH
- Joerg Franke
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for the detection of a relative movement
- Patent number 8,593,136
- Issue date Nov 26, 2013
- Micronas GmbH
- Joerg Franke
- G01 - MEASURING TESTING
Information Patent Grant
Self-testing sensor apparatus and method
- Patent number 8,378,672
- Issue date Feb 19, 2013
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor component
- Patent number 8,125,070
- Issue date Feb 28, 2012
- Micronas GmbH
- Stefan Kredler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital-to-analog converter circuit layout
- Patent number 7,821,438
- Issue date Oct 26, 2010
- Micronas, GmbH
- Laurent Avon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Mount for a programmable electronic processing device
- Patent number 7,675,165
- Issue date Mar 9, 2010
- Micronas GmbH
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Receptacle for a programmable, electronic processing device
- Patent number 7,138,712
- Issue date Nov 21, 2006
- Micronas GmbH
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Iterative interpolator
- Patent number 5,740,089
- Issue date Apr 14, 1998
- Deutsche ITT Industries GmbH
- Andreas Menkhoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Master-slave data transmission system employing a flexible single-w...
- Patent number 5,495,240
- Issue date Feb 27, 1996
- Deutsche ITT Industries GmbH
- Klaus Heberle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Floating data interface
- Patent number 5,399,965
- Issue date Mar 21, 1995
- Deutsche ITT Industries GmbH
- Klaus Heberle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wireless remote control and zoom system for a video display apparatus
- Patent number 5,302,968
- Issue date Apr 12, 1994
- Deutsche ITT Industries GmbH
- Klaus Heberle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Master-slave data transmission system employing a flexible single-w...
- Patent number 5,237,322
- Issue date Aug 17, 1993
- Deutsche ITT Industries GmbH
- Klaus Heberle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Remote-control system with a spread-spectrum transmission link
- Patent number 5,220,580
- Issue date Jun 15, 1993
- Deutsche ITT Industries GmbH
- Klaus Heberle
- G08 - SIGNALLING
Information Patent Grant
Projection television system employing optics through which transmi...
- Patent number 5,170,258
- Issue date Dec 8, 1992
- Deutsche ITT Industries GmbH
- Ljubomir Micic
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wireless remote control system for a television receiver
- Patent number 5,146,210
- Issue date Sep 8, 1992
- Deutsche ITT Industries GmbH
- Klaus Heberle
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IC PACKAGE
- Publication number 20180130729
- Publication date May 10, 2018
- TDK - Micronas GmbH
- Klaus HEBERLE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTING DEVICE
- Publication number 20180054008
- Publication date Feb 22, 2018
- TDK - Micronas GmbH
- Timo KAUFMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITION DETERMINING UNIT
- Publication number 20170254669
- Publication date Sep 7, 2017
- TDK - Micronas GmbH
- Joerg FRANKE
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETERMINING SENSOR UNIT
- Publication number 20170254668
- Publication date Sep 7, 2017
- TDK - Micronas GmbH
- Joerg FRANKE
- G01 - MEASURING TESTING
Information Patent Application
TEST MATRIX ADAPTER DEVICE
- Publication number 20170227578
- Publication date Aug 10, 2017
- TDK - Micronas GmbH
- Timo KAUFMANN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT DEVICE SYSTEM
- Publication number 20170054238
- Publication date Feb 23, 2017
- Micronas GmbH
- Johannes GUTMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IC PACKAGE
- Publication number 20160204055
- Publication date Jul 14, 2016
- Micronas GmbH
- Klaus HEBERLE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INJECTION-MOLDED CIRCUIT CARRIER
- Publication number 20160061634
- Publication date Mar 3, 2016
- Micronas GmbH
- Joerg FRANKE
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASURING DEVICE
- Publication number 20160033587
- Publication date Feb 4, 2016
- Micronas GmbH
- Timo KAUFMANN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL COMPONENT
- Publication number 20160037641
- Publication date Feb 4, 2016
- Micronas GmbH
- Joerg FRANKE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MEASURING SYSTEM
- Publication number 20140333298
- Publication date Nov 13, 2014
- Micronas GmbH
- Klaus HEBERLE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM
- Publication number 20140333299
- Publication date Nov 13, 2014
- Micronas GmbH
- Klaus HEBERLE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED MAGNETIC FIELD SENSOR AND METHOD FOR A MEASUREMENT OF TH...
- Publication number 20130154618
- Publication date Jun 20, 2013
- Micronas GmbH
- Klaus HEBERLE
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR AND METHOD FOR DETECTING A CURRENTLESS STATE
- Publication number 20130099781
- Publication date Apr 25, 2013
- Micronas GmbH
- Klaus HEBERLE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A DISTANCE AND AN INTEGRATED MAGNETIC FIELD...
- Publication number 20130099777
- Publication date Apr 25, 2013
- Micronas GmbH
- Klaus HEBERLE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR THE DETECTION OF A RELATIVE MOVEMENT
- Publication number 20110291645
- Publication date Dec 1, 2011
- Joerg Franke
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHIP AND METHOD FOR GENERATING PULSE EDGES, ASSIGNED...
- Publication number 20110291650
- Publication date Dec 1, 2011
- Joerg Franke
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL-TO-ANALOG CONVERTER CIRCUIT LAYOUT
- Publication number 20090295614
- Publication date Dec 3, 2009
- Laurent Avon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrated Circuit for Controlling an Electric Motor
- Publication number 20090278531
- Publication date Nov 12, 2009
- Micronas GmbH
- Jorg Franke
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Semiconductor Component
- Publication number 20090152548
- Publication date Jun 18, 2009
- Micronas GmbH
- Stefan Kredler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor component and method for testing such a component
- Publication number 20080224694
- Publication date Sep 18, 2008
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Application
Mount for a programmable electronic processing device
- Publication number 20070035018
- Publication date Feb 15, 2007
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Receptacle for a programmable, electronic processing device
- Publication number 20050062126
- Publication date Mar 24, 2005
- Klaus Heberle
- H01 - BASIC ELECTRIC ELEMENTS

Klaus Heberle

Person

Patents Grantslast 30 patents

Position determining sensor unit

Test matrix adapter device

Position determining unit

Contacting device

IC package

IC package

Contact device system

Injection-molded circuit carrier

Magnetic field measuring device

Integrated magnetic field sensor and method for a measurement of th...

Measuring system

Measuring system

Method for determining a distance and an integrated magnetic field...

Integrated circuit for controlling an electric motor

Current sensor and method for detecting a currentless state

Semiconductor chip and method for generating pulse edges, assigned...

Measuring apparatus for the detection of a relative movement

Self-testing sensor apparatus and method

Semiconductor component

Digital-to-analog converter circuit layout

Mount for a programmable electronic processing device

Receptacle for a programmable, electronic processing device

Iterative interpolator

Master-slave data transmission system employing a flexible single-w...

Floating data interface

Wireless remote control and zoom system for a video display apparatus

Master-slave data transmission system employing a flexible single-w...

Remote-control system with a spread-spectrum transmission link

Projection television system employing optics through which transmi...

Wireless remote control system for a television receiver

Patents Applicationslast 30 patents

IC PACKAGE

CONTACTING DEVICE

POSITION DETERMINING UNIT

POSITION DETERMINING SENSOR UNIT

TEST MATRIX ADAPTER DEVICE

CONTACT DEVICE SYSTEM

IC PACKAGE

INJECTION-MOLDED CIRCUIT CARRIER

MAGNETIC FIELD MEASURING DEVICE

ELECTRICAL COMPONENT

MEASURING SYSTEM

MEASURING SYSTEM

INTEGRATED MAGNETIC FIELD SENSOR AND METHOD FOR A MEASUREMENT OF TH...

CURRENT SENSOR AND METHOD FOR DETECTING A CURRENTLESS STATE

METHOD FOR DETERMINING A DISTANCE AND AN INTEGRATED MAGNETIC FIELD...

MEASURING APPARATUS FOR THE DETECTION OF A RELATIVE MOVEMENT

SEMICONDUCTOR CHIP AND METHOD FOR GENERATING PULSE EDGES, ASSIGNED...

DIGITAL-TO-ANALOG CONVERTER CIRCUIT LAYOUT

Integrated Circuit for Controlling an Electric Motor

Semiconductor Component

Semiconductor component and method for testing such a component

Mount for a programmable electronic processing device

Receptacle for a programmable, electronic processing device