Klaus Heinzelmann

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Leinfelden-Echterdingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Scan verification for a scan-chain device under test
- Patent number 7,386,775
- Issue date Jun 10, 2008
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Pre-Mortem Waveform Trace Generation for Hardware Description Langu...
- Publication number 20080141071
- Publication date Jun 12, 2008
- Stephen C. Bergman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan verification for a device under test
- Publication number 20070061644
- Publication date Mar 15, 2007
- International Business Machines Corporation
- Parag Birmiwal
- G01 - MEASURING TESTING