Membership
Tour
Register
Log in
Klaus Heyn
Follow
Person
Hamburg, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Forward scatter sensor
Patent number
11,079,312
Issue date
Aug 3, 2021
Vaisala Oyj
Klaus Heyn
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining visibility, amount of precipitation and type...
Patent number
7,122,820
Issue date
Oct 17, 2006
Vaisala Impulsphysik GmbH
Stefan Engel
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring the optical range of optical and electronics s...
Patent number
5,610,713
Issue date
Mar 11, 1997
Jenoptik AG
Klaus Heyn
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FORWARD SCATTER SENSOR
Publication number
20200103330
Publication date
Apr 2, 2020
Vaisala Oyj
Klaus HEYN
G01 - MEASURING TESTING
Information
Patent Application
Method and combined visibility and precipitation measuring instrume...
Publication number
20020158215
Publication date
Oct 31, 2002
Vaisala Impulsphysik GMbH
Stefan Engel
G01 - MEASURING TESTING