Klaus Standner

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Villach, AT

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus with low-reflection signal distribution
- Patent number 7,355,414
- Issue date Apr 8, 2008
- Infineon Technologies, AG
- Ralf Arnold
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND METHOD FOR PRODUCING A PROBE CARD
- Publication number 20150168456
- Publication date Jun 18, 2015
- Karl Dominizi
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus with low-reflection signal distribution
- Publication number 20060186896
- Publication date Aug 24, 2006
- Ralf Arnold
- G01 - MEASURING TESTING