Knut Heitmann

Person

Wetzlar, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Acoustic screen scan microscope for the examination of an object in...
- Patent number 5,212,987
- Issue date May 25, 1993
- Hommelwerke GmbH
- Klaus Dransfeld
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Process for modifying structural profiles in resist layers
- Patent number 4,672,012
- Issue date Jun 9, 1987
- Ernst Leitz Wetzlar GmbH
- Knut Heitmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for local selective detection and generation o...
- Patent number 4,669,313
- Issue date Jun 2, 1987
- Ernst Leitz Wetzlar GmbH
- Klaus Dransfeld
- G01 - MEASURING TESTING
Information Patent Grant
Process for producing structures in resist layers using ultrasonic...
- Patent number 4,612,267
- Issue date Sep 16, 1986
- Ernst Leitz Wetzlar GmbH
- Knut Heitmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mirror reflex camera with exposure meter
- Patent number 4,496,231
- Issue date Jan 29, 1985
- Ernst Leitz Wetzlar GmbH
- Knut Heitmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reflex camera with electronic range finder
- Patent number 4,447,143
- Issue date May 8, 1984
- Ernst Leitz Wetzlar GmbH
- Knut Heitmann
- G02 - OPTICS
Information Patent Grant
Object measuring method and apparatus
- Patent number 4,226,535
- Issue date Oct 7, 1980
- Ernst Leitz Wetzlar GmbH
- Knut Heitmann
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring position and/or velocity
- Patent number 4,195,425
- Issue date Apr 1, 1980
- Ernst Leitz Wetzlar GmbH
- Ludwig Leitz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring distances
- Patent number 4,175,365
- Issue date Nov 27, 1979
- Ernst Leitz Wetzlar GmbH
- Ludwig Leitz
- G02 - OPTICS

Knut Heitmann

Person

Patents Grantslast 30 patents

Acoustic screen scan microscope for the examination of an object in...

Process for modifying structural profiles in resist layers

Method and apparatus for local selective detection and generation o...

Process for producing structures in resist layers using ultrasonic...

Mirror reflex camera with exposure meter

Reflex camera with electronic range finder

Object measuring method and apparatus

System for measuring position and/or velocity

Method and apparatus for measuring distances