Knut Hiltawski

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Saalfeld, DE

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Patents Grantslast 30 patents

Information Patent Grant
System for inspecting a disk-shaped object
- Patent number 7,426,024
- Issue date Sep 16, 2008
- Vistec Semiconductor Systems Jena GmbH
- René Schenck
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for transporting and inspecting semiconducto...
- Patent number 7,028,565
- Issue date Apr 18, 2006
- Leica Microsystems Jena GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate conveying module and system made up of substrate conveyin...
- Patent number 6,962,471
- Issue date Nov 8, 2005
- Leica Microsystems Jena GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement and method for the identification of substrates
- Patent number 6,845,174
- Issue date Jan 18, 2005
- Leica Microsystems Jena GmbH
- Dominik Grau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and arrangement for transporting and inspecting semiconducto...
- Patent number 6,789,436
- Issue date Sep 14, 2004
- Leica Microsystems Jena GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and arrangement for transporting and inspecting semiconducto...
- Patent number 6,553,850
- Issue date Apr 29, 2003
- Leica Microsystems Jena GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and arrangement for transporting and inspecting semiconducto...
- Publication number 20040149055
- Publication date Aug 5, 2004
- LEICA MICROSYSTEMS JENA GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inserting carriage for measuring and/or analytical device
- Publication number 20040046544
- Publication date Mar 11, 2004
- Knut Hiltawski
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method and arrangement for transporting and inspecting semiconducto...
- Publication number 20030140716
- Publication date Jul 31, 2003
- LEICA MICROSYSTEMS JENA GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrangement and method for the identification of substrates
- Publication number 20020097905
- Publication date Jul 25, 2002
- LEICA MICROSYSTEMS JENA GmbH
- Dominik Grau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and arrangement for transporting and inspecting semiconducto...
- Publication number 20020095999
- Publication date Jul 25, 2002
- LEICA MICROSYSTEMS JENA GmbH
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate conveying module and system made up of substrate conveyin...
- Publication number 20020051698
- Publication date May 2, 2002
- Andreas Birkner
- H01 - BASIC ELECTRIC ELEMENTS