Ko-Bin Kao

Person

Shengang Township, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for liquid leak detection
- Patent number 12,025,533
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu Kai Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of manufacturing conductors and semiconductor dev...
- Patent number 11,688,730
- Issue date Jun 27, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kam-Tou Sio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for liquid leak detection
- Patent number 11,199,466
- Issue date Dec 14, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu Kai Chen
- G01 - MEASURING TESTING
Information Patent Grant
Chemical replacement system
- Patent number 11,029,603
- Issue date Jun 8, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu Kai Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring gas in wafer processing system
- Patent number 11,004,709
- Issue date May 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of manufacturing conductors and semiconductor dev...
- Patent number 10,978,439
- Issue date Apr 13, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kam-Tou Sio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoresist bottle container
- Patent number 10,943,802
- Issue date Mar 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu Kai Chen
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Lithographic technique for feature cut by line-end shrink
- Patent number 10,763,113
- Issue date Sep 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing conductors and semiconductor device which i...
- Patent number 10,388,644
- Issue date Aug 20, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Kam-Tou Sio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithographic technique for feature cut by line-end shrink
- Patent number 10,388,523
- Issue date Aug 20, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithographic technique for feature cut by line-end shrink
- Patent number 9,984,876
- Issue date May 29, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithographic technique for feature cut by line-end shrink
- Patent number 9,613,850
- Issue date Apr 4, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of patterning small via pitch dimensions
- Patent number 9,099,530
- Issue date Aug 4, 2015
- Taiwan Semiconductor Manufacturing Compnay, Ltd.
- Chung-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask assignment optimization
- Patent number 9,003,336
- Issue date Apr 7, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of patterning small via pitch dimensions
- Patent number 8,728,332
- Issue date May 20, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterning process and materials for lithography
- Patent number 8,563,231
- Issue date Oct 22, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Wei Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of inhibiting photoresist pattern collapse
- Patent number 8,101,340
- Issue date Jan 24, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ching-Yu Chang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR LIQUID LEAK DETECTION
- Publication number 20240344915
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Kai CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING CONDUCTORS FOR SEMICONDUCTOR DEVICE
- Publication number 20230335545
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kam-Tou SIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR LIQUID LEAK DETECTION
- Publication number 20220082468
- Publication date Mar 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Kai CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF MANUFACTURING CONDUCTORS AND SEMICONDUCTOR DEV...
- Publication number 20210225831
- Publication date Jul 22, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kam-Tou SIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL REPLACEMENT SYSTEM
- Publication number 20200103756
- Publication date Apr 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu Kai CHEN
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SYSTEM AND METHOD FOR LIQUID LEAK DETECTION
- Publication number 20200072696
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Kai CHEN
- G01 - MEASURING TESTING
Information Patent Application
PHOTORESIST BOTTLE CONTAINER
- Publication number 20200043762
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu Kai CHEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHIC TECHNIQUE FOR FEATURE CUT BY LINE-END SHRINK
- Publication number 20190378712
- Publication date Dec 12, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF MANUFACTURING CONDUCTORS AND SEMICONDUCTOR DEV...
- Publication number 20190371784
- Publication date Dec 5, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kam-Tou SIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING GAS IN WAFER PROCESSING SYSTEM
- Publication number 20190157124
- Publication date May 23, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Chieh HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PROC...
- Publication number 20190146348
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Kai Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHIC TECHNIQUE FOR FEATURE CUT BY LINE-END SHRINK
- Publication number 20180277358
- Publication date Sep 27, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING CONDUCTORS AND SEMICONDUCTOR DEVICE WHICH I...
- Publication number 20180151552
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kam-Tou SIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHIC TECHNIQUE FOR FEATURE CUT BY LINE-END SHRINK
- Publication number 20170207081
- Publication date Jul 20, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lithographic Technique for Feature Cut by Line-End Shrink
- Publication number 20160181110
- Publication date Jun 23, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mask Assignment Optimization
- Publication number 20140248768
- Publication date Sep 4, 2014
- Wen-Chun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods of Patterning Small Via Pitch Dimensions
- Publication number 20140242794
- Publication date Aug 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF PATTERNING SMALL VIA PITCH DIMENSIONS
- Publication number 20130295769
- Publication date Nov 7, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chung-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERNING PROCESS AND MATERIALS FOR LITHOGRAPHY
- Publication number 20130075364
- Publication date Mar 28, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Wei Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED DIPOLE LITHOGRAPHY
- Publication number 20110212403
- Publication date Sep 1, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Jhih Kuo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Inhibiting Photoresist Pattern Collapse
- Publication number 20070264594
- Publication date Nov 15, 2007
- Ching-Yu Chang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

System and method for liquid leak detection

Method and system of manufacturing conductors and semiconductor dev...

System and method for liquid leak detection

Chemical replacement system

Method for monitoring gas in wafer processing system

Method and system of manufacturing conductors and semiconductor dev...

Photoresist bottle container

Lithographic technique for feature cut by line-end shrink

Method of manufacturing conductors and semiconductor device which i...

Lithographic technique for feature cut by line-end shrink

Lithographic technique for feature cut by line-end shrink

Lithographic technique for feature cut by line-end shrink

Methods of patterning small via pitch dimensions

Mask assignment optimization

Methods of patterning small via pitch dimensions

Patterning process and materials for lithography

Method of inhibiting photoresist pattern collapse

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR LIQUID LEAK DETECTION

METHOD OF MANUFACTURING CONDUCTORS FOR SEMICONDUCTOR DEVICE

SYSTEM AND METHOD FOR LIQUID LEAK DETECTION

METHOD AND SYSTEM OF MANUFACTURING CONDUCTORS AND SEMICONDUCTOR DEV...

CHEMICAL REPLACEMENT SYSTEM

SYSTEM AND METHOD FOR LIQUID LEAK DETECTION

PHOTORESIST BOTTLE CONTAINER

LITHOGRAPHIC TECHNIQUE FOR FEATURE CUT BY LINE-END SHRINK

METHOD AND SYSTEM OF MANUFACTURING CONDUCTORS AND SEMICONDUCTOR DEV...

METHOD FOR MONITORING GAS IN WAFER PROCESSING SYSTEM

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PROC...

LITHOGRAPHIC TECHNIQUE FOR FEATURE CUT BY LINE-END SHRINK

METHOD OF MANUFACTURING CONDUCTORS AND SEMICONDUCTOR DEVICE WHICH I...

LITHOGRAPHIC TECHNIQUE FOR FEATURE CUT BY LINE-END SHRINK

Lithographic Technique for Feature Cut by Line-End Shrink

Mask Assignment Optimization

Methods of Patterning Small Via Pitch Dimensions

METHODS OF PATTERNING SMALL VIA PITCH DIMENSIONS

PATTERNING PROCESS AND MATERIALS FOR LITHOGRAPHY

METHOD AND APPARATUS FOR ENHANCED DIPOLE LITHOGRAPHY

Method of Inhibiting Photoresist Pattern Collapse