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Ko Ishizuka
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Saitama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Absolute encoder that provides increased accuracy against defect in...
Patent number
9,810,555
Issue date
Nov 7, 2017
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional absolute encoder and scale with marks each having o...
Patent number
9,267,820
Issue date
Feb 23, 2016
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional absolute encoder and scale therefor
Patent number
9,040,900
Issue date
May 26, 2015
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer
Patent number
8,860,949
Issue date
Oct 14, 2014
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Absolute rotary encoder
Patent number
8,785,838
Issue date
Jul 22, 2014
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Absolute rotary encoder
Patent number
8,759,747
Issue date
Jun 24, 2014
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Encoder and interferometer that generate M-phase signals by multipl...
Patent number
8,742,322
Issue date
Jun 3, 2014
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength shift measuring apparatus, optical source apparatus, int...
Patent number
8,416,387
Issue date
Apr 9, 2013
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measurement apparatus
Patent number
8,243,279
Issue date
Aug 14, 2012
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Origin detection apparatus, displacement measurement apparatus and...
Patent number
8,228,508
Issue date
Jul 24, 2012
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Absolute position measurement apparatus
Patent number
7,554,671
Issue date
Jun 30, 2009
Canon Kabushiki Kaisha
Hidejiro Kadowaki
G01 - MEASURING TESTING
Information
Patent Grant
Absolute position measurement apparatus
Patent number
7,551,290
Issue date
Jun 23, 2009
Canon Kabushiki Kaisha
Hidejiro Kadowaki
G01 - MEASURING TESTING
Information
Patent Grant
Position detection apparatus and method
Patent number
7,391,521
Issue date
Jun 24, 2008
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Interference measuring apparatus for detecting a plurality of stabl...
Patent number
7,375,820
Issue date
May 20, 2008
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Grating interference type optical encoder
Patent number
7,259,863
Issue date
Aug 21, 2007
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Grating interference type optical encoder
Patent number
7,061,624
Issue date
Jun 13, 2006
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detection apparatus, and magnetic recording apparatus...
Patent number
7,054,095
Issue date
May 30, 2006
Canon Kabushiki Kaisha
Ko Ishizuka
G11 - INFORMATION STORAGE
Information
Patent Grant
Compact interference measuring apparatus for detecting the magnitud...
Patent number
7,034,947
Issue date
Apr 25, 2006
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction grating interference system encoder for detecting displ...
Patent number
6,958,469
Issue date
Oct 25, 2005
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Encoder
Patent number
6,674,066
Issue date
Jan 6, 2004
Canon Kabushiki Kaisha
Yasushi Kaneda
G01 - MEASURING TESTING
Information
Patent Grant
Optical element used in compact interference measuring apparatus de...
Patent number
6,657,181
Issue date
Dec 2, 2003
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detecting apparatus and information recording apparatus
Patent number
6,618,218
Issue date
Sep 9, 2003
Canon Kabushiki Kaisha
Hidejiro Kadowaki
G11 - INFORMATION STORAGE
Information
Patent Grant
Measuring instrument
Patent number
6,570,660
Issue date
May 27, 2003
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Interference device and position detection device using the same
Patent number
6,493,170
Issue date
Dec 10, 2002
Canon Kabushiki Kaisha
Shigeki Kato
G11 - INFORMATION STORAGE
Information
Patent Grant
Interferometer which divides light beams into a plurality of beams...
Patent number
6,473,184
Issue date
Oct 29, 2002
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection apparatus for detecting information relating to r...
Patent number
5,666,196
Issue date
Sep 9, 1997
Canon Kabushiki Kaisha
Satoshi Ishii
G01 - MEASURING TESTING
Information
Patent Grant
Encoder with an optical scale and interference of zero and first or...
Patent number
5,481,106
Issue date
Jan 2, 1996
Canon Kabushiki Kaisha
Masaru Nyui
G01 - MEASURING TESTING
Information
Patent Grant
Optical apparatus and displacement-information measuring apparatus...
Patent number
5,448,358
Issue date
Sep 5, 1995
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Grant
Encoder utilizing interference using multi-mode semiconductor laser
Patent number
5,198,873
Issue date
Mar 30, 1993
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20150300847
Publication date
Oct 22, 2015
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL ABSOLUTE ENCODER AND SCALE
Publication number
20140070073
Publication date
Mar 13, 2014
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
SCALE AND MANUFACTURING METHOD THEREOF, AND ABSOLUTE ENCODER
Publication number
20130026351
Publication date
Jan 31, 2013
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL ABSOLUTE ENCODER AND SCALE THEREFOR
Publication number
20120326016
Publication date
Dec 27, 2012
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ROTARY ENCODER
Publication number
20120153135
Publication date
Jun 21, 2012
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ROTARY ENCODER
Publication number
20120153136
Publication date
Jun 21, 2012
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20120032068
Publication date
Feb 9, 2012
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER
Publication number
20110299093
Publication date
Dec 8, 2011
Canon Kabushiki Kaisha
Ko ISHIZUKA
G01 - MEASURING TESTING
Information
Patent Application
HETERODYNE INTERFEROMETRY DISPLACEMENT MEASUREMENT APPARATUS
Publication number
20110249270
Publication date
Oct 13, 2011
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER
Publication number
20110220780
Publication date
Sep 15, 2011
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER AND DISPLACEMENT MEASUREMENT APPARATUS HAVING THE SAME
Publication number
20110222073
Publication date
Sep 15, 2011
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
HETERODYNE INTERFEROMETER
Publication number
20110096334
Publication date
Apr 28, 2011
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
ORIGIN DETECTION APPARATUS, DISPLACEMENT MEASUREMENT APPARATUS AND...
Publication number
20100208271
Publication date
Aug 19, 2010
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH SHIFT MEASURING APPARATUS, OPTICAL SOURCE APPARATUS, INT...
Publication number
20100103403
Publication date
Apr 29, 2010
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT MEASUREMENT APPARATUS
Publication number
20100079767
Publication date
Apr 1, 2010
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
INTERFERENCE MEASUREMENT APPARATUS
Publication number
20070024862
Publication date
Feb 1, 2007
Canon Kabushiki Kaisha
Hidejiro Kadowaki
G01 - MEASURING TESTING
Information
Patent Application
INTERFERENCE MEASUREMENT APPARATUS
Publication number
20070024863
Publication date
Feb 1, 2007
Canon Kabushiki Kaisha
Hidejiro Kadowaki
G01 - MEASURING TESTING
Information
Patent Application
Grating interference type optical encoder
Publication number
20060203252
Publication date
Sep 14, 2006
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
Surface reflection type phase grating
Publication number
20060140538
Publication date
Jun 29, 2006
Taisuke Isano
G02 - OPTICS
Information
Patent Application
Interference measuring apparatus
Publication number
20060114474
Publication date
Jun 1, 2006
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
Position detection apparatus and method
Publication number
20060082783
Publication date
Apr 20, 2006
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
Grating interference type optical encoder
Publication number
20040151508
Publication date
Aug 5, 2004
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
Compact interference measuring apparatus detecting plurality of pha...
Publication number
20030223075
Publication date
Dec 4, 2003
Canon Kabushiki Kaisha
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
Displacement information detector
Publication number
20030193017
Publication date
Oct 16, 2003
Ko Ishizuka
G01 - MEASURING TESTING
Information
Patent Application
Measuring instrument
Publication number
20020021448
Publication date
Feb 21, 2002
Ko Ishizuka
G01 - MEASURING TESTING