Kobi Barkan

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Holon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Optical system and method for inspection of patterned samples
- Patent number 8,614,790
- Issue date Dec 24, 2013
- Applied Materials Israel, Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
- Publication number 20130148114
- Publication date Jun 13, 2013
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTION OF PATTERNED SAMPLES
- Publication number 20130148115
- Publication date Jun 13, 2013
- Yoav Berlatzky
- G01 - MEASURING TESTING