Kobi Kan

Follow

Person

Givatayim, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning microscopy using inhomogeneous polarization
- Patent number 8,228,601
- Issue date Jul 24, 2012
- Applied Materials Israel, Ltd.
- Doron Meshulach
- G02 - OPTICS
Information Patent Grant
High throughput across-wafer-variation mapping
- Patent number 7,990,546
- Issue date Aug 2, 2011
- Applied Materials Israel, Ltd.
- Jeong Ho Yeo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING MICROSCOPY USING INHOMOGENEOUS POLARIZATION
- Publication number 20090284835
- Publication date Nov 19, 2009
- Doron Meshulach
- G02 - OPTICS
Information Patent Application
HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING
- Publication number 20090021749
- Publication date Jan 22, 2009
- Jeong Ho Yeo
- G01 - MEASURING TESTING