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Koby Duckworth
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Newberg, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probes with fiducial targets, probe systems including the same, and...
Patent number
10,877,070
Issue date
Dec 29, 2020
FormFactor Beaverton, Inc.
Joseph George Frankel
G01 - MEASURING TESTING
Information
Patent Grant
Probe systems and methods
Patent number
10,459,006
Issue date
Oct 29, 2019
FormFactor Beaverton, Inc.
Gavin Neil Fisher
G01 - MEASURING TESTING
Information
Patent Grant
Probe head assemblies, components thereof, test systems including t...
Patent number
9,989,558
Issue date
Jun 5, 2018
Cascade Microtech, Inc.
Koby Duckworth
G01 - MEASURING TESTING
Information
Patent Grant
Resilient electrical interposers, systems that include the interpos...
Patent number
9,874,585
Issue date
Jan 23, 2018
Cascade Microtech, Inc.
Kenneth R. Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe head assemblies, components thereof, test systems including t...
Patent number
9,244,099
Issue date
Jan 26, 2016
Cascade Microtech, Inc.
Koby Duckworth
G01 - MEASURING TESTING
Information
Patent Grant
Resilient electrical interposers, systems that include the interpos...
Patent number
9,099,449
Issue date
Aug 4, 2015
Cascade Microtech, Inc.
Kenneth R. Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Resilient electrical interposers, systems that include the interpos...
Patent number
8,970,240
Issue date
Mar 3, 2015
Cascade Microtech, Inc.
Kenneth R. Smith
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE SYSTEMS AND METHODS
Publication number
20200041544
Publication date
Feb 6, 2020
FormFactor Beaverton, Inc.
Gavin Neil Fisher
G01 - MEASURING TESTING
Information
Patent Application
PROBES WITH FIDUCIAL TARGETS, PROBE SYSTEMS INCLUDING THE SAME, AND...
Publication number
20190227102
Publication date
Jul 25, 2019
FormFactor Beaverton, Inc.
Joseph George Frankel
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEMS AND METHODS
Publication number
20180088149
Publication date
Mar 29, 2018
Cascade Microtech, Inc.
Gavin Neil Fisher
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...
Publication number
20160103153
Publication date
Apr 14, 2016
Cascade Microtech, Inc.
Koby Duckworth
G01 - MEASURING TESTING
Information
Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
Publication number
20150301082
Publication date
Oct 22, 2015
Cascade Microtech, Inc.
Kenneth R. Smith
G01 - MEASURING TESTING
Information
Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
Publication number
20150114925
Publication date
Apr 30, 2015
Cascade Microtech, Inc.
Kenneth R. Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUI...
Publication number
20130069680
Publication date
Mar 21, 2013
Cascade Microtech, Inc.
Koby L. Duckworth
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...
Publication number
20120286817
Publication date
Nov 15, 2012
Cascade Microtech, Inc.
Koby Duckworth
G01 - MEASURING TESTING
Information
Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
Publication number
20120112779
Publication date
May 10, 2012
Cascade Microtech, Inc.
Kenneth R. Smith
G01 - MEASURING TESTING