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Kodai NIINA

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  • Kyoto-shi, Kyoto, JP
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Patents Applicationslast 30 patents

  • Information Patent Application

    ANALYSIS DEVICE AND ANALYSIS METHOD
    • Publication number 20250012712
    • Publication date Jan 9, 2025
    • Horiba, Ltd.
    • Kohei TACHIBANA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR LASER DEVICE
    • Publication number 20240146020
    • Publication date May 2, 2024
    • HORIBA, LTD.
    • Yusuke AWANE
    • H01 - BASIC ELECTRIC ELEMENTS