Kodo Kawase

Person

Aichi-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Terahertz beam scanning apparatus and method thereof
- Patent number 8,121,157
- Issue date Feb 21, 2012
- Riken
- Ken-ichiro Maki
- G02 - OPTICS
Information Patent Grant
Collection-amount detection method for particulate matters and coll...
- Patent number 8,119,988
- Issue date Feb 21, 2012
- Toyota Jidosha Kabushiki Kaisha
- Shigeki Daido
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for inspecting target by tera-hertz wave spect...
- Patent number 7,381,955
- Issue date Jun 3, 2008
- Riken
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting materials
- Patent number 7,352,449
- Issue date Apr 1, 2008
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting scattered material by terahertz...
- Patent number 7,291,838
- Issue date Nov 6, 2007
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for diagnosing fault in semiconductor device
- Patent number 7,173,447
- Issue date Feb 6, 2007
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting wire breaking of integrated cir...
- Patent number 6,980,010
- Issue date Dec 27, 2005
- Riken
- Masayoshi Tonouchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for generating tera-Hertz wave and tuning method
- Patent number 6,903,341
- Issue date Jun 7, 2005
- Riken
- Kazuhiro Imai
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ BEAM SCANNING APPARATUS AND METHOD THEREOF
- Publication number 20110037001
- Publication date Feb 17, 2011
- Riken
- Ken-ichiro Maki
- G02 - OPTICS
Information Patent Application
COLLECTION-AMOUNT DETECTION METHOD FOR PARTICULATE MATTERS AND COLL...
- Publication number 20100187089
- Publication date Jul 29, 2010
- Shigeki Daido
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method and equipment for judging target by tera heltz wave spectrom...
- Publication number 20060219922
- Publication date Oct 5, 2006
- Yuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting scattered material by Terahertz...
- Publication number 20060043298
- Publication date Mar 2, 2006
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for diagnosing fault in semiconductor device
- Publication number 20060006886
- Publication date Jan 12, 2006
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting materials
- Publication number 20050116170
- Publication date Jun 2, 2005
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting wire breaking of integrated cir...
- Publication number 20040246011
- Publication date Dec 9, 2004
- Riken
- Masayoshi Tonouchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for differential imaging using terahertz wave
- Publication number 20040061055
- Publication date Apr 1, 2004
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for generating tera-herz wave and tuning method
- Publication number 20030227668
- Publication date Dec 11, 2003
- Riken
- Kazuhiro Imai
- G02 - OPTICS
Information Patent Application
Method and apparatus for generating tera-herz wave
- Publication number 20020024718
- Publication date Feb 28, 2002
- Riken
- Kodo Kawase
- G02 - OPTICS

Kodo Kawase

Person

Patents Grantslast 30 patents

Terahertz beam scanning apparatus and method thereof

Collection-amount detection method for particulate matters and coll...

Method and apparatus for inspecting target by tera-hertz wave spect...

Method and apparatus for detecting materials

Apparatus and method for detecting scattered material by terahertz...

Method and apparatus for diagnosing fault in semiconductor device

Method and apparatus for inspecting wire breaking of integrated cir...

Apparatus for generating tera-Hertz wave and tuning method

Patents Applicationslast 30 patents

TERAHERTZ BEAM SCANNING APPARATUS AND METHOD THEREOF

COLLECTION-AMOUNT DETECTION METHOD FOR PARTICULATE MATTERS AND COLL...

Method and equipment for judging target by tera heltz wave spectrom...

Apparatus and method for detecting scattered material by Terahertz...

Method and apparatus for diagnosing fault in semiconductor device

Method and apparatus for detecting materials

Method and apparatus for inspecting wire breaking of integrated cir...

Method and apparatus for differential imaging using terahertz wave

Apparatus for generating tera-herz wave and tuning method

Method and apparatus for generating tera-herz wave