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Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 9,176,008
- Issue date Nov 3, 2015
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,493,057
- Issue date Jul 23, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20130240736
- Publication date Sep 19, 2013
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
HOLDING FIXTURE, PLACEMENT METHOD OF HOLDING FIXTURE, AND MEASUREME...
- Publication number 20100321682
- Publication date Dec 23, 2010
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20100295534
- Publication date Nov 25, 2010
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING