Koenraad VAN INGEN SCHENAU

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Process window based on defect probability
- Patent number 11,822,255
- Issue date Nov 21, 2023
- ASML Netherlands B.V.
- Abraham Slachter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining control parameters of a device manufacturing...
- Patent number 11,768,442
- Issue date Sep 26, 2023
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing a manufacturing process and associated appara...
- Patent number 11,733,606
- Issue date Aug 22, 2023
- ASML Netherlands B.V.
- Thomas Theeuwes
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining control parameters of a device manufacturing...
- Patent number 11,513,442
- Issue date Nov 29, 2022
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window based on defect probability
- Patent number 11,079,687
- Issue date Aug 3, 2021
- ASML Netherlands B.V.
- Abraham Slachter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PROCESS WINDOW BASED ON DEFECT PROBABILITY
- Publication number 20240126181
- Publication date Apr 18, 2024
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...
- Publication number 20240012337
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALIBRATING SIMULATION PROCESS BASED ON DEFECT-BASED PRO...
- Publication number 20230076218
- Publication date Mar 9, 2023
- ASML NETHERLANDS B.V.
- Koenraad VAN INGEN SCHENAU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...
- Publication number 20230058839
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS WINDOW BASED ON DEFECT PROBABILITY
- Publication number 20210356874
- Publication date Nov 18, 2021
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR PERFORMING A MANUFACTURING PROCESS AND ASSOCIATED APPARA...
- Publication number 20210240073
- Publication date Aug 5, 2021
- ASML NETHERLANDS B.V.
- Thomas THEEUWES
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...
- Publication number 20210149312
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS WINDOW BASED ON DEFECT PROBABILITY
- Publication number 20210018850
- Publication date Jan 21, 2021
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Koenraad VAN INGEN SCHENAU

Person

Patents Grantslast 30 patents

Process window based on defect probability

Method of determining control parameters of a device manufacturing...

Method for performing a manufacturing process and associated appara...

Method of determining control parameters of a device manufacturing...

Process window based on defect probability

Patents Applicationslast 30 patents

PROCESS WINDOW BASED ON DEFECT PROBABILITY

METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...

METHOD FOR CALIBRATING SIMULATION PROCESS BASED ON DEFECT-BASED PRO...

METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...

PROCESS WINDOW BASED ON DEFECT PROBABILITY

METHOD FOR PERFORMING A MANUFACTURING PROCESS AND ASSOCIATED APPARA...

METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...

PROCESS WINDOW BASED ON DEFECT PROBABILITY