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Koetsu SAWAI
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
10,103,075
Issue date
Oct 16, 2018
Renesas Electronics Corporation
Yoshiki Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
9,721,857
Issue date
Aug 1, 2017
Renesas Electronics Corporation
Yoshiki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
9,299,720
Issue date
Mar 29, 2016
Renesas Electronics Corporation
Yoshiki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20170287795
Publication date
Oct 5, 2017
RENESAS ELECTRONICS CORPORATION
Yoshiki YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20160197021
Publication date
Jul 7, 2016
RENESAS ELECTRONICS CORPORATION
Yoshiki YAMAMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
Publication number
20150179673
Publication date
Jun 25, 2015
RENESAS ELECTRONICS CORPORATION
Yoshiki YAMAMOTO
H01 - BASIC ELECTRIC ELEMENTS