Kohei HIROKI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 12,241,905
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Kohei Hiroki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 12,031,995
- Issue date Jul 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Kohei Hiroki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20220018867
- Publication date Jan 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Kohei HIROKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20210247412
- Publication date Aug 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Kohei HIROKI
- G01 - MEASURING TESTING