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Kohei Hironaka

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  • Nagano, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Contact probe and probe unit
    • Patent number 11,656,246
    • Issue date May 23, 2023
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe unit
    • Patent number 11,422,156
    • Issue date Aug 23, 2022
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe unit
    • Patent number 11,320,461
    • Issue date May 3, 2022
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Conductive contactor unit
    • Patent number 11,293,946
    • Issue date Apr 5, 2022
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Conductive probe for inspection and semiconductor inspection device
    • Patent number 10,274,517
    • Issue date Apr 30, 2019
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test unit
    • Patent number 10,120,011
    • Issue date Nov 6, 2018
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe unit
    • Patent number 10,082,525
    • Issue date Sep 25, 2018
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe-unit base member and probe unit
    • Patent number 8,633,724
    • Issue date Jan 21, 2014
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe unit
    • Patent number 8,344,747
    • Issue date Jan 1, 2013
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Conductive contact holder and conductive contact unit
    • Patent number 8,096,840
    • Issue date Jan 17, 2012
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Conductive contact holder
    • Patent number 7,845,955
    • Issue date Dec 7, 2010
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Needle-like member, conductive contact, and conductive contact unit
    • Patent number 7,815,438
    • Issue date Oct 19, 2010
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CONTACT PROBE AND PROBE UNIT
    • Publication number 20220317155
    • Publication date Oct 6, 2022
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE AND PROBE UNIT
    • Publication number 20210156887
    • Publication date May 27, 2021
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT
    • Publication number 20200225265
    • Publication date Jul 16, 2020
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONDUCTIVE CONTACTOR UNIT
    • Publication number 20200141975
    • Publication date May 7, 2020
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONDUCTIVE PROBE FOR INSPECTION AND SEMICONDUCTOR INSPECTION DEVICE
    • Publication number 20180238932
    • Publication date Aug 23, 2018
    • NHK Spring Co., Ltd.
    • Kohei HIRONAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT
    • Publication number 20170299631
    • Publication date Oct 19, 2017
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST UNIT
    • Publication number 20170010315
    • Publication date Jan 12, 2017
    • NHK Spring Co., Ltd.
    • Kohei HIRONAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOCKET ATTACHMENT STRUCTURE AND SPRING MEMBER
    • Publication number 20150139722
    • Publication date May 21, 2015
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBE-UNIT BASE MEMBER AND PROBE UNIT
    • Publication number 20110227596
    • Publication date Sep 22, 2011
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT
    • Publication number 20110025358
    • Publication date Feb 3, 2011
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONDUCTIVE CONTACT HOLDER AND CONDUCTIVE CONTACT UNIT
    • Publication number 20100184306
    • Publication date Jul 22, 2010
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    Conductive Contact Holder
    • Publication number 20090311890
    • Publication date Dec 17, 2009
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Needle-like member, conductive contact, and conductive contact unit
    • Publication number 20070128906
    • Publication date Jun 7, 2007
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING