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Kohei Miyase
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Fukuoka-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Fault detection system, generation circuit, and program
Patent number
9,383,408
Issue date
Jul 5, 2016
Japan Science and Technology Agency
Yasuo Sato
G01 - MEASURING TESTING
Information
Patent Grant
Don't-care-bit identification method and don't-care-bit identificat...
Patent number
8,589,751
Issue date
Nov 19, 2013
LPTEX Corporation
Kohei Miyase
G01 - MEASURING TESTING
Information
Patent Grant
Target logic value determination method for unspecified bit in test...
Patent number
8,453,023
Issue date
May 28, 2013
LPTEX Corporation
Kohei Miyase
G01 - MEASURING TESTING
Information
Patent Grant
Generating device, generating method, and program
Patent number
8,429,472
Issue date
Apr 23, 2013
National University Corporation Kyushu University Institute of Technology
Kohei Miyase
G01 - MEASURING TESTING
Information
Patent Grant
Conversion device, conversion method, program, and recording medium
Patent number
8,037,387
Issue date
Oct 11, 2011
Japan Science and Technology Agency
Seiji Kajihara
G01 - MEASURING TESTING
Information
Patent Grant
Test pattern generation method for avoiding false testing in two-pa...
Patent number
8,001,437
Issue date
Aug 16, 2011
Kyushu Institute of Technology
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Grant
Generating device, generating method, program and recording medium
Patent number
7,979,765
Issue date
Jul 12, 2011
Japan Science and Technology Agency
Xiaoqing Wen
G11 - INFORMATION STORAGE
Information
Patent Grant
Conversion device, conversion method, program, and recording medium
Patent number
7,971,118
Issue date
Jun 28, 2011
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Grant
Generating device, generating method, program and recording medium
Patent number
7,962,822
Issue date
Jun 14, 2011
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic device, diagnostic method, program, and recording medium
Patent number
7,913,144
Issue date
Mar 22, 2011
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FAULT DETECTION SYSTEM, GENERATION CIRCUIT, AND PROGRAM
Publication number
20150247898
Publication date
Sep 3, 2015
Kyushu Institute of Technology
Yasuo Sato
G01 - MEASURING TESTING
Information
Patent Application
GENERATION DEVICE, CLASSIFICATION METHOD, GENERATION METHOD, AND PR...
Publication number
20110209024
Publication date
Aug 25, 2011
KYUSHU INSTITUTE OF TEHNOLOGY
Meng-Fan Wu
G01 - MEASURING TESTING
Information
Patent Application
GENERATING DEVICE, GENERATING METHOD, AND PROGRAM
Publication number
20110140734
Publication date
Jun 16, 2011
Kohei Miyase
G01 - MEASURING TESTING
Information
Patent Application
DON'T-CARE-BIT IDENTIFICATION METHOD AND DON'T-CARE-BIT IDENTIFICAT...
Publication number
20100218063
Publication date
Aug 26, 2010
Kyushu Institute of Technology
Kohei Miyase
G01 - MEASURING TESTING
Information
Patent Application
LOGIC VALUE DETERMINATION METHOD AND LOGIC VALUE DETERMINATION PROGRAM
Publication number
20100205491
Publication date
Aug 12, 2010
Kyushu Institute of Technology
Kohei Miyase
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEST PATTERN GENERATION METHOD FOR AVOIDING FALSE TESTING IN TWO-PA...
Publication number
20100095179
Publication date
Apr 15, 2010
Kyushu Institute of Technology
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM
Publication number
20100064191
Publication date
Mar 11, 2010
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
Publication number
20090319842
Publication date
Dec 24, 2009
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
Publication number
20090113261
Publication date
Apr 30, 2009
Japan Science and Technology Agency
Seiji Kajihara
G01 - MEASURING TESTING
Information
Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
Publication number
20090019327
Publication date
Jan 15, 2009
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING
Information
Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
Publication number
20080235543
Publication date
Sep 25, 2008
Japan Science and Technology Agency
Xiaoqing Wen
G01 - MEASURING TESTING