Kohei ODA

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen measurement apparatus and method performed in specimen mea...
- Patent number 12,188,951
- Issue date Jan 7, 2025
- Sysmex Corporation
- Jun Inagaki
- G01 - MEASURING TESTING
Information Patent Grant
Transport system, sample analyzer, sample rack, and transport regul...
- Patent number 11,977,089
- Issue date May 7, 2024
- Sysmex Corporation
- Kohei Oda
- G01 - MEASURING TESTING
Information Patent Grant
Transport system, sample analyzer, sample rack, and transport regul...
- Patent number 11,946,946
- Issue date Apr 2, 2024
- Sysmex Corporation
- Kohei Oda
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 11,680,951
- Issue date Jun 20, 2023
- Sysmex Corporation
- Kohei Oda
- G01 - MEASURING TESTING
Information Patent Grant
Transport system, sample analyzer, sample rack, and transport regul...
- Patent number 11,493,524
- Issue date Nov 8, 2022
- Sysmex Corporation
- Kohei Oda
- G01 - MEASURING TESTING
Information Patent Grant
Sample rack
- Patent number 11,346,853
- Issue date May 31, 2022
- Sysmex Corporation
- Kohei Oda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
- Publication number 20230280363
- Publication date Sep 7, 2023
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
TRANSPORT SYSTEM, SAMPLE ANALYZER, SAMPLE RACK, AND TRANSPORT REGUL...
- Publication number 20230019592
- Publication date Jan 19, 2023
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN MEASUREMENT APPARATUS AND METHOD PERFORMED IN SPECIMEN MEA...
- Publication number 20200103425
- Publication date Apr 2, 2020
- SYSMEX CORPORATION
- Jun INAGAKI
- G01 - MEASURING TESTING
Information Patent Application
TRANSPORT SYSTEM, SAMPLE ANALYZER, SAMPLE RACK, AND TRANSPORT REGUL...
- Publication number 20200072855
- Publication date Mar 5, 2020
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
- Publication number 20200072860
- Publication date Mar 5, 2020
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE RACK
- Publication number 20200072857
- Publication date Mar 5, 2020
- SYSMEX CORPORATION
- Kohei ODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20180267069
- Publication date Sep 20, 2018
- SYSMEX CORPORATION
- Hironori KATSUMI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20180259545
- Publication date Sep 13, 2018
- SYSMEX CORPORATION
- Hironori KATSUMI
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Specimen measurement apparatus and method performed in specimen mea...

Transport system, sample analyzer, sample rack, and transport regul...

Transport system, sample analyzer, sample rack, and transport regul...

Sample analyzer and sample analyzing method

Transport system, sample analyzer, sample rack, and transport regul...

Sample rack

Patents Applicationslast 30 patents

SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD

TRANSPORT SYSTEM, SAMPLE ANALYZER, SAMPLE RACK, AND TRANSPORT REGUL...

SPECIMEN MEASUREMENT APPARATUS AND METHOD PERFORMED IN SPECIMEN MEA...

TRANSPORT SYSTEM, SAMPLE ANALYZER, SAMPLE RACK, AND TRANSPORT REGUL...

SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD

SAMPLE RACK

SAMPLE ANALYZER

SAMPLE ANALYZER