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Kohtaro Hosoya
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for adjusting charged particle beam device and adjusting bea...
Patent number
10,176,968
Issue date
Jan 8, 2019
Hitachi High-Technologies Corporation
Kunji Shigeto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and sample observation method
Patent number
9,362,083
Issue date
Jun 7, 2016
Hitachi High-Technologies Corporation
Yusuke Ominami
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
Publication number
20160118218
Publication date
Apr 28, 2016
Hitachi High-Technologies Corporation
Kunji SHIGETO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus and Sample Observation Method
Publication number
20150221470
Publication date
Aug 6, 2015
Hitachi High-Technologies Corporation
Yusuke Ominami
H01 - BASIC ELECTRIC ELEMENTS