Koichi Asami

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Kodama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Object holding apparatus, and inspection apparatus
- Patent number 8,686,383
- Issue date Apr 1, 2014
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Grant
Optical defect inspection apparatus
- Patent number 8,472,016
- Issue date Jun 25, 2013
- Hitachi High-Technologies Corporation
- Yuuichiro Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Optical defect inspection apparatus
- Patent number 8,184,283
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Yuuichiro Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Substrate holding apparatus, and inspection or processing apparatus
- Patent number 8,183,549
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Grant
Substrate holding apparatus, and inspection or processing apparatus
- Patent number 7,999,242
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Grant
Substrate holding apparatus, and inspection or processing apparatus
- Patent number 7,723,709
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS
- Publication number 20120205850
- Publication date Aug 16, 2012
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEFECT INSPECTION APPARATUS
- Publication number 20120182547
- Publication date Jul 19, 2012
- Hitachi High-Technologies Corporation
- Noriyuki Aizawa
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS
- Publication number 20110260080
- Publication date Oct 27, 2011
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE HOLDING APPARATUS, AND INSPECTION OR PROCESSING APPARATUS
- Publication number 20100196127
- Publication date Aug 5, 2010
- Hitachi High-Technologies Corporation
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
Substrate holding apparatus, and inspection or processing apparatus
- Publication number 20080054197
- Publication date Mar 6, 2008
- Kazuhiro Zama
- G01 - MEASURING TESTING
Information Patent Application
Optical defect inspection apparatus
- Publication number 20070211241
- Publication date Sep 13, 2007
- Noriyuki Aizawa
- G01 - MEASURING TESTING