Koichi Ekawa

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Kyoto-fu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometric measuring instrument
- Patent number 7,411,685
- Issue date Aug 12, 2008
- Omron Corporation
- Jun Takashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLASSIFICATION CONDITION SETTING SUPPORT APPARATUS
- Publication number 20230237640
- Publication date Jul 27, 2023
- Omron Corporation
- Koichi EKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spectrometric measuring instrument
- Publication number 20060114470
- Publication date Jun 1, 2006
- OMRON CORPORATION
- Jun Takashima
- G01 - MEASURING TESTING
Information Patent Application
Two-dimensional spectroscopic system and film thickness measuring s...
- Publication number 20050094160
- Publication date May 5, 2005
- OMRON CORPORATION
- Hideyuki Murai
- G01 - MEASURING TESTING