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Koichi Hikida
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Touch panel that uses transparent conductor
Patent number
7,932,467
Issue date
Apr 26, 2011
TDK Corporation
Chieko Yamada
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Acceleration measuring device
Patent number
7,653,507
Issue date
Jan 26, 2010
Asahi Kasei EMD Corporation
Rikita Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Transparent conductor
Patent number
7,507,465
Issue date
Mar 24, 2009
TDK Corporation
Noriyuki Yasuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Azimuth measuring device
Patent number
7,376,527
Issue date
May 20, 2008
Asahi Kasei EMD Corporation
Koichi Hikida
G01 - MEASURING TESTING
Information
Patent Grant
Transparent conductor
Patent number
7,288,716
Issue date
Oct 30, 2007
TDK Corporation
Chieko Yamada
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Azimuth measuring device and azimuth measuring method
Patent number
7,177,779
Issue date
Feb 13, 2007
Asahi Kasei EMD Corporation
Koichi Hikida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Acceleration Measuring Device
Publication number
20080033679
Publication date
Feb 7, 2008
Rikita Yamada
G01 - MEASURING TESTING
Information
Patent Application
Azimuth Measuring Device
Publication number
20070276625
Publication date
Nov 29, 2007
Koichi Hikida
G01 - MEASURING TESTING
Information
Patent Application
Touch panel that uses transparent conductor
Publication number
20070268277
Publication date
Nov 22, 2007
TDK Corporation
Chieko YAMADA
G02 - OPTICS
Information
Patent Application
TRANSPARENT CONDUCTOR
Publication number
20070000678
Publication date
Jan 4, 2007
TDK Corporation
Chieko YAMADA
G02 - OPTICS
Information
Patent Application
Transparent conductor
Publication number
20060222859
Publication date
Oct 5, 2006
TDK Corporation
Noriyuki Yasuda
B32 - LAYERED PRODUCTS
Information
Patent Application
Azimuth measuring device and azimuth measuring method
Publication number
20050256673
Publication date
Nov 17, 2005
Koichi Hikida
G01 - MEASURING TESTING
Information
Patent Application
Inclination sensor, method of manufacturing inclination sensor, and...
Publication number
20050151448
Publication date
Jul 14, 2005
Koichi Hikida
G01 - MEASURING TESTING