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Koichi Homma
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Sagamihara, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Spatial information search system
Patent number
6,708,183
Issue date
Mar 16, 2004
Hitachi, Ltd.
Maki Mori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for cooperatively operating river management facilities
Patent number
5,812,421
Issue date
Sep 22, 1998
Hitachi, Ltd.
Kenji Fujii
E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information
Patent Grant
Data receiving system for receiving data signal faded and delayed
Patent number
5,659,584
Issue date
Aug 19, 1997
Matsushita Electric Industrial Co., Ltd.
Mitsuru Uesugi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System for sending frames from sender to receiver using connectionl...
Patent number
5,572,678
Issue date
Nov 5, 1996
Hitachi, Ltd.
Koichi Homma
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Visual merchandizing (VMD) control method and system
Patent number
5,383,111
Issue date
Jan 17, 1995
Hitachi, Ltd.
Koichi Homma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Navigation system and method using map data
Patent number
5,311,173
Issue date
May 10, 1994
Hitachi, Ltd.
Fuminobu Komura
G01 - MEASURING TESTING
Information
Patent Grant
Inventory control method and system
Patent number
5,237,496
Issue date
Aug 17, 1993
Hitachi, Ltd.
Akira Kagami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of multi-dimensional analysis and display for a large volume...
Patent number
5,179,643
Issue date
Jan 12, 1993
Hitachi, Ltd.
Koichi Homma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inventory control method and system
Patent number
5,128,861
Issue date
Jul 7, 1992
Hitachi, Ltd.
Akira Kagami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope and method of processing the same
Patent number
5,001,344
Issue date
Mar 19, 1991
Hitachi, Ltd.
Makoto Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of measuring surface topography by using scanning electron m...
Patent number
4,912,313
Issue date
Mar 27, 1990
Hitachi Ltd.
Makoto Kato
G01 - MEASURING TESTING
Information
Patent Grant
Image correction system for scanning electron microscope
Patent number
4,907,287
Issue date
Mar 6, 1990
Hitachi, Ltd.
Koichi Homma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope
Patent number
4,803,358
Issue date
Feb 7, 1989
Hitachi, Ltd.
Makoto Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image correction processing method
Patent number
4,695,964
Issue date
Sep 22, 1987
Hitachi, Ltd.
Youichi Seto
G01 - MEASURING TESTING
Information
Patent Grant
Image correction processing method and apparatus
Patent number
4,682,300
Issue date
Jul 21, 1987
Hitachi, Ltd.
Youichi Seto
G01 - MEASURING TESTING
Information
Patent Grant
Method of reconstructing synthetic aperture radar image
Patent number
4,616,227
Issue date
Oct 7, 1986
Hitachi, Ltd.
Koichi Homma
G01 - MEASURING TESTING