Koichi Inagaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Material shape simulation apparatus, material shape simulation meth...
- Patent number 10,745,832
- Issue date Aug 18, 2020
- IHI Corporation
- Hiroyuki Hishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting arrangement disorder of fibers in conductive c...
- Patent number 10,656,121
- Issue date May 19, 2020
- IHI Corporation
- Akinori Tsuda
- G01 - MEASURING TESTING
Information Patent Grant
Support apparatus, design support method, and program
- Patent number 10,650,173
- Issue date May 12, 2020
- IHI Corporation
- Hiroyuki Hishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting electroconductive composite material and devi...
- Patent number 10,605,777
- Issue date Mar 31, 2020
- IHI Corporation
- Hiroki Kawai
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection apparatus
- Patent number 10,242,436
- Issue date Mar 26, 2019
- IHI Corporation
- Koichi Inagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber waviness detection method and apparatus for conductive compos...
- Patent number 10,132,778
- Issue date Nov 20, 2018
- IHI Corporation
- Akinori Tsuda
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Image analysis apparatus, image analysis method, and program
- Patent number 10,068,349
- Issue date Sep 4, 2018
- IHI Corporation
- Hiroyuki Hishida
- D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information Patent Grant
Image analyzing apparatus and program
- Patent number 9,824,435
- Issue date Nov 21, 2017
- IHI Corporation
- HIroyuki Hishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image analyzing apparatus and program
- Patent number 9,811,898
- Issue date Nov 7, 2017
- IHI Corporation
- Hiroyuki Hishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Molded part
- Patent number 9,739,175
- Issue date Aug 22, 2017
- IHI Corporation
- Takashi Harada
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Ultrasonic flaw detecting apparatus, ultrasonic transducer, and ult...
- Patent number 9,719,966
- Issue date Aug 1, 2017
- IHI Corporation
- Koichi Inagaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING ARRANGEMENT DISORDER OF FIBERS IN CONDUCTIVE C...
- Publication number 20190079054
- Publication date Mar 14, 2019
- IHI Corporation
- Akinori TSUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING ELECTROCONDUCTIVE COMPOSITE MATERIAL AND DEVI...
- Publication number 20190072521
- Publication date Mar 7, 2019
- IHI Corporation
- Hiroki KAWAI
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL SHAPE SIMULATION APPARATUS, MATERIAL SHAPE SIMULATION METH...
- Publication number 20190040553
- Publication date Feb 7, 2019
- IHI Corporation
- Hiroyuki HISHIDA
- D03 - WEAVING
Information Patent Application
RACK BAR AND RACK BAR MANUFACTURING METHOD
- Publication number 20180306303
- Publication date Oct 25, 2018
- Neturen Co., Ltd.
- Koichi INAGAKI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
DESIGN SUPPORT APPARATUS, DESIGN SUPPORT METHOD, AND PROGRAM
- Publication number 20170308631
- Publication date Oct 26, 2017
- IHI Corporation
- Hiroyuki HISHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ANALYSIS APPARATUS, IMAGE ANALYSIS METHOD, AND PROGRAM
- Publication number 20170213357
- Publication date Jul 27, 2017
- IHI CORPORATION
- Hiroyuki HISHIDA
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION APPARATUS
- Publication number 20170046831
- Publication date Feb 16, 2017
- IHI Corporation
- Koichi INAGAKI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYZING APPARATUS AND PROGRAM
- Publication number 20160247271
- Publication date Aug 25, 2016
- IHI Corporation
- Hiroyuki HISHIDA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ANALYZING APPARATUS AND PROGRAM
- Publication number 20160232653
- Publication date Aug 11, 2016
- IHI Corporation
- Hiroyuki HISHIDA
- G01 - MEASURING TESTING
Information Patent Application
FIBER WAVINESS DETECTION METHOD AND APPARATUS FOR CONDUCTIVE COMPOS...
- Publication number 20160209365
- Publication date Jul 21, 2016
- IHI Corporation
- Akinori TSUDA
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC FLAW DETECTING APPARATUS, ULTRASONIC TRANSDUCER, AND ULT...
- Publication number 20140083193
- Publication date Mar 27, 2014
- IHI Corporation
- Koichi INAGAKI
- G01 - MEASURING TESTING
Information Patent Application
MOLDED PART
- Publication number 20140044539
- Publication date Feb 13, 2014
- Ihi Aerospace Co., Ltd.
- Takashi HARADA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Program recording and distributing system, program recording and di...
- Publication number 20010037511
- Publication date Nov 1, 2001
- NEC Corporation
- Koichi Inagaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Koichi Inagaki

Person

Patents Grantslast 30 patents

Material shape simulation apparatus, material shape simulation meth...

Method for detecting arrangement disorder of fibers in conductive c...

Support apparatus, design support method, and program

Method for inspecting electroconductive composite material and devi...

Non-destructive inspection apparatus

Fiber waviness detection method and apparatus for conductive compos...

Image analysis apparatus, image analysis method, and program

Image analyzing apparatus and program

Image analyzing apparatus and program

Molded part

Ultrasonic flaw detecting apparatus, ultrasonic transducer, and ult...

Patents Applicationslast 30 patents

METHOD FOR DETECTING ARRANGEMENT DISORDER OF FIBERS IN CONDUCTIVE C...

METHOD FOR INSPECTING ELECTROCONDUCTIVE COMPOSITE MATERIAL AND DEVI...

MATERIAL SHAPE SIMULATION APPARATUS, MATERIAL SHAPE SIMULATION METH...

RACK BAR AND RACK BAR MANUFACTURING METHOD

DESIGN SUPPORT APPARATUS, DESIGN SUPPORT METHOD, AND PROGRAM

IMAGE ANALYSIS APPARATUS, IMAGE ANALYSIS METHOD, AND PROGRAM

NON-DESTRUCTIVE INSPECTION APPARATUS

IMAGE ANALYZING APPARATUS AND PROGRAM

IMAGE ANALYZING APPARATUS AND PROGRAM

FIBER WAVINESS DETECTION METHOD AND APPARATUS FOR CONDUCTIVE COMPOS...

ULTRASONIC FLAW DETECTING APPARATUS, ULTRASONIC TRANSDUCER, AND ULT...

MOLDED PART

Program recording and distributing system, program recording and di...