Koichi Iwao

Follow

Person

Kodaira-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit, method of testing the semiconduct...
- Patent number 11,774,493
- Issue date Oct 3, 2023
- Canon Kabushiki Kaisha
- Koichi Iwao
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, image sensing apparatus, electronic equipment...
- Patent number 10,650,905
- Issue date May 12, 2020
- Canon Kabushiki Kaisha
- Koichi Iwao
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, METHOD OF TESTING THE SEMICONDUCT...
- Publication number 20220317180
- Publication date Oct 6, 2022
- Canon Kabushiki Kaisha
- Koichi Iwao
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, IMAGE SENSING APPARATUS, ELECTRONIC EQUIPMENT...
- Publication number 20190198129
- Publication date Jun 27, 2019
- Canon Kabushiki Kaisha
- Koichi Iwao
- B60 - VEHICLES IN GENERAL