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Koichi KAJIYOSHI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Data processing apparatus, method of obtaining characteristic of ea...
Patent number
10,551,510
Issue date
Feb 4, 2020
Rigaku Corporation
Takuto Sakumura
G01 - MEASURING TESTING
Information
Patent Grant
Image processing method and image processing apparatus
Patent number
9,558,582
Issue date
Jan 31, 2017
Rigaku Corporation
Takuto Sakumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray diffraction apparatus and method of measuring X-ray diffraction
Patent number
9,322,792
Issue date
Apr 26, 2016
Rigaku Corporation
Shintaro Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus, X-ray analysis system, X-ray analysis met...
Patent number
9,006,673
Issue date
Apr 14, 2015
Rigaku Corporation
Kazuki Ito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DATA PROCESSING APPARATUS, METHOD OF OBTAINING CHARACTERISTIC OF EA...
Publication number
20180203132
Publication date
Jul 19, 2018
Rigaku Corporation
Takuto SAKUMURA
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING APPARATUS
Publication number
20150213623
Publication date
Jul 30, 2015
Rigaku Corporation
Takuto SAKUMURA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS AND METHOD OF MEASURING X-RAY DIFFRACTION
Publication number
20150146861
Publication date
May 28, 2015
Rigaku Corporation
Shintaro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS APPARATUS, X-RAY ANALYSIS SYSTEM, X-RAY ANALYSIS MET...
Publication number
20140021364
Publication date
Jan 23, 2014
Kazuki ITO
G01 - MEASURING TESTING