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Koichi Kojima
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Nagano-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Defect detecting method and defect detecting device
Patent number
7,978,903
Issue date
Jul 12, 2011
Seiko Epson Corporation
Koichi Kojima
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Manufacturing system, measurement data collecting system, and measu...
Patent number
7,107,114
Issue date
Sep 12, 2006
Seiko Epson Corporation
Yoshifumi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lens evaluation method and lens-evaluating apparatus
Patent number
6,989,894
Issue date
Jan 24, 2006
Seiko Epson Corporation
Masashi Kitabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Measurement data collection apparatus
Patent number
6,978,219
Issue date
Dec 20, 2005
Seiko Epson Corporation
Koichi Kojima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Manufacturing system, measurement data collecting system, and measu...
Patent number
6,934,596
Issue date
Aug 23, 2005
Seiko Epson Corporation
Yoshifumi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for positional adjustment of light modulator
Patent number
6,894,841
Issue date
May 17, 2005
Seiko Epson Corporation
Masashi Kitabayashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement data collection apparatus
Patent number
6,892,158
Issue date
May 10, 2005
Seiko Epson Corporation
Koichi Kojima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Lens testing device and testing sheet
Patent number
6,788,401
Issue date
Sep 7, 2004
Seiko Epson Corporation
Masashi Kitabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Lens evaluation method and lens-evaluating apparatus
Patent number
6,760,097
Issue date
Jul 6, 2004
Seiko Epson Corporation
Masashi Kitabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Lens-evaluating method and lens-evaluating apparatus
Patent number
6,760,096
Issue date
Jul 6, 2004
Seiko Epson Corporation
Masashi Kitabayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Defect detecting method and defect detecting device
Publication number
20070047801
Publication date
Mar 1, 2007
Seiko Epson Corporation
Koichi Kojima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Manufacturing system, measurement data collecting system, and measu...
Publication number
20050192695
Publication date
Sep 1, 2005
Yoshifumi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Measurement data collection apparatus
Publication number
20050182580
Publication date
Aug 18, 2005
Koichi Kojima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Lens evaluation method and lens-evaluating apparatus
Publication number
20040179191
Publication date
Sep 16, 2004
SEIKO EPSON CORPORATION
Masashi Kitabayashi
G01 - MEASURING TESTING
Information
Patent Application
Device and method for positional adjustment of light modulator
Publication number
20040095652
Publication date
May 20, 2004
Masashi Kitabayashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Manufacturing system, measurement data collecting system, and measu...
Publication number
20030176939
Publication date
Sep 18, 2003
Yoshifumi Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Measurement data collection apparatus
Publication number
20030176990
Publication date
Sep 18, 2003
Koichi Kojima
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Lens-evaluating method and lens-evaluating apparatus
Publication number
20030048436
Publication date
Mar 13, 2003
SEIKO EPSON CORPORATION
Masashi Kitabayashi
G01 - MEASURING TESTING
Information
Patent Application
Lens evaluation method and lens-evaluating apparatus
Publication number
20020044275
Publication date
Apr 18, 2002
SEIKO EPSON CORPORATION
Masashi Kitabayashi
G01 - MEASURING TESTING