Koichi Miyazono

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Feature analyzing apparatus for a surface of an object
- Patent number 8,700,498
- Issue date Apr 15, 2014
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Substrate surface inspecting apparatus and substrate surface inspec...
- Patent number 8,508,246
- Issue date Aug 13, 2013
- Shibaura Mechatronics Corporation
- Hiroshi Wakaba
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method based on captured image and inspection device
- Patent number 8,497,985
- Issue date Jul 30, 2013
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device for disk-shaped substrate
- Patent number 8,488,867
- Issue date Jul 16, 2013
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FEATURE ANALYZING APPARATUS
- Publication number 20100310150
- Publication date Dec 9, 2010
- Yoshinori Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE SURFACE INSPECTING APPARATUS AND SUBSTRATE SURFACE INSPEC...
- Publication number 20100310152
- Publication date Dec 9, 2010
- Shibaura Mechatronics Coporation
- Hiroshi Wakaba
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR DISK-SHAPED SUBSTRATE
- Publication number 20100246934
- Publication date Sep 30, 2010
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD BASED ON CAPTURED IMAGE AND INSPECTION DEVICE
- Publication number 20100245810
- Publication date Sep 30, 2010
- Yoshinori Hayashi
- G01 - MEASURING TESTING