Koichi Nagoya

Person

Konosu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device, display device, and defect classification...
- Patent number 9,964,500
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 8,422,009
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for defect inspection
- Patent number 8,154,717
- Issue date Apr 10, 2012
- Hitachi High-Technologies Corporation
- Seiji Otani
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,986,405
- Issue date Jul 26, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for defect inspection
- Patent number 7,787,115
- Issue date Aug 31, 2010
- Hitachi High-Technologies Corporation
- Seiji Otani
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,719,671
- Issue date May 18, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for defect inspection
- Patent number 7,557,913
- Issue date Jul 7, 2009
- Hitachi High-Technologies Coropration
- Seiji Otani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Inspection Device, Display Device, and Defect Classification...
- Publication number 20170328846
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Hisashi HATANO
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20110267605
- Publication date Nov 3, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS FOR DEFECT INSPECTION
- Publication number 20100315626
- Publication date Dec 16, 2010
- Hitachi High-Technologies Corporation
- Seiji Otani
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20100195095
- Publication date Aug 5, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS FOR DEFECT INSPECTION
- Publication number 20090251690
- Publication date Oct 8, 2009
- Hitachi High-Technologies Corporation
- Seiji Otani
- G01 - MEASURING TESTING
Information Patent Application
Optical apparatus for defect inspection
- Publication number 20080002195
- Publication date Jan 3, 2008
- Hitachi High-Technologies Corporation
- Seiji Otani
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection method and foreign matter inspection appa...
- Publication number 20070201019
- Publication date Aug 30, 2007
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Koichi Nagoya

Person

Patents Grantslast 30 patents

Defect inspection device, display device, and defect classification...

Foreign matter inspection method and foreign matter inspection appa...

Optical apparatus for defect inspection

Foreign matter inspection method and foreign matter inspection appa...

Optical apparatus for defect inspection

Foreign matter inspection method and foreign matter inspection appa...

Optical apparatus for defect inspection

Patents Applicationslast 30 patents

Defect Inspection Device, Display Device, and Defect Classification...

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

OPTICAL APPARATUS FOR DEFECT INSPECTION

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

OPTICAL APPARATUS FOR DEFECT INSPECTION

Optical apparatus for defect inspection

Foreign matter inspection method and foreign matter inspection appa...