Koichi Niino

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Composite chip component, circuit assembly and electronic apparatus
- Patent number 10,681,815
- Issue date Jun 9, 2020
- Rohm Co., Ltd.
- Hiroshi Tamagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite chip component, circuit assembly and electronic apparatus
- Patent number 10,321,570
- Issue date Jun 11, 2019
- Rohm Co., Ltd.
- Hiroshi Tamagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card
- Patent number 9,410,987
- Issue date Aug 9, 2016
- Rohm Co., Ltd.
- Goro Nakatani
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for manufacturing probe card, probe card, method for manufac...
- Patent number 8,970,242
- Issue date Mar 3, 2015
- ROHM Co, Ltd.
- Goro Nakatani
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITE CHIP COMPONENT, CIRCUIT ASSEMBLY AND ELECTRONIC APPARATUS
- Publication number 20190200458
- Publication date Jun 27, 2019
- Rohm Co., Ltd.
- Hiroshi TAMAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHIP COMPONENT, CIRCUIT ASSEMBLY AND ELECTRONIC APPARATUS
- Publication number 20160050760
- Publication date Feb 18, 2016
- Rohm Co., Ltd.
- Hiroshi TAMAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING PROBE CARD, PROBE CARD, METHOD FOR MANUFAC...
- Publication number 20150123691
- Publication date May 7, 2015
- Rohm Co., Ltd.
- Goro Nakatani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PROBE CARD, PROBE CARD, METHOD FOR MANUFAC...
- Publication number 20110175637
- Publication date Jul 21, 2011
- Rohm Co., Ltd.
- Goro Nakatani
- G01 - MEASURING TESTING