Koichi OBARI

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Tsuchiura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample handling system
- Patent number 10,852,314
- Issue date Dec 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Kuniaki Onizawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 10,768,186
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Eiji Takaya
- G01 - MEASURING TESTING
Information Patent Grant
Sample handling system
- Patent number 10,386,380
- Issue date Aug 20, 2019
- Hitachi High-Technologies Corporation
- Kuniaki Onizawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaporation control of a sample stored in a cold container
- Patent number 9,863,969
- Issue date Jan 9, 2018
- Hitachi High-Technologies Corporation
- Kuniaki Onizawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample handling system
- Patent number 9,097,691
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Kuniaki Onizawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HANDLING SYSTEM
- Publication number 20190331704
- Publication date Oct 31, 2019
- Hitachi High-Technologies Corporation
- Kuniaki ONIZAWA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HANDLING SYSTEM
- Publication number 20180095101
- Publication date Apr 5, 2018
- Hitachi High-Technologies Corporation
- Kuniaki ONIZAWA
- G01 - MEASURING TESTING
Information Patent Application
Inspection Device
- Publication number 20180052183
- Publication date Feb 22, 2018
- Hitachi High-Technologies Corporation
- Eiji TAKAYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HANDLING SYSTEM
- Publication number 20150285828
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Kuniaki ONIZAWA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HANDLING SYSTEM
- Publication number 20080286162
- Publication date Nov 20, 2008
- Kuniaki ONIZAWA
- G01 - MEASURING TESTING