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Koichi Okubo
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Hyogo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Reagent preparing device, reagent preparing method, and specimen pr...
Patent number
10,161,950
Issue date
Dec 25, 2018
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Sample sorting apparatus, sample processing system, and sample sort...
Patent number
10,001,498
Issue date
Jun 19, 2018
Sysmex Corporation
Kei Takai
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus with sample feeding unit
Patent number
9,310,389
Issue date
Apr 12, 2016
Sysmex Corporation
Nobuhiro Kitagawa
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, reagent preparing method and specimen pro...
Patent number
9,207,250
Issue date
Dec 8, 2015
SYSMEX CORPORATION
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, specimen processing system and reagent pr...
Patent number
9,164,021
Issue date
Oct 20, 2015
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Blood sample analyzing apparatus, blood sample coagulation determin...
Patent number
9,103,816
Issue date
Aug 11, 2015
Sysmex Corporation
Tokihiro Kosaka
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, specimen measuring device and reagent pre...
Patent number
8,906,302
Issue date
Dec 9, 2014
Sysmex Corporation
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device and specimen processing system
Patent number
8,894,932
Issue date
Nov 25, 2014
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus, sample container transporting apparatu...
Patent number
8,698,644
Issue date
Apr 15, 2014
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
8,194,235
Issue date
Jun 5, 2012
Sysmex Corporation
Tokihiro Kosaka
G01 - MEASURING TESTING
Information
Patent Grant
Method for producing superconducting acceleration cavity
Patent number
8,042,258
Issue date
Oct 25, 2011
Mitsubishi Heavy Industries, Ltd.
Katsuya Sennyu
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Particle detector and particle analyzer employing the same
Patent number
6,909,269
Issue date
Jun 21, 2005
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE SORTING APPARATUS, SAMPLE PROCESSING SYSTEM, AND SAMPLE SORT...
Publication number
20140079527
Publication date
Mar 20, 2014
SYSMEX CORPORATION
Kei TAKAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE TRANSPORTING DEVICE
Publication number
20120009087
Publication date
Jan 12, 2012
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS, SAMPLE CONTAINER TRANSPORTING APPARATU...
Publication number
20110316713
Publication date
Dec 29, 2011
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD
Publication number
20110065193
Publication date
Mar 17, 2011
Nobuhiro Kitagawa
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE AND SPECIMEN PROCESSING SYSTEM
Publication number
20100247383
Publication date
Sep 30, 2010
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, REAGENT PREPARING METHOD, AND SPECIMEN PR...
Publication number
20100248208
Publication date
Sep 30, 2010
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, REAGENT PREPARING METHOD AND SPECIMEN PRO...
Publication number
20100248289
Publication date
Sep 30, 2010
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, SPECIMEN MEASURING DEVICE AND REAGENT PRE...
Publication number
20100216223
Publication date
Aug 26, 2010
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, SPECIMEN PROCESSING SYSTEM AND REAGENT PR...
Publication number
20100216224
Publication date
Aug 26, 2010
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer
Publication number
20100066996
Publication date
Mar 18, 2010
Sysmex Corporation
Tokihiro Kosaka
G01 - MEASURING TESTING
Information
Patent Application
Blood sample analyzing apparatus, blood sample coagulation determin...
Publication number
20100027868
Publication date
Feb 4, 2010
Sysmex Corporation
Tokihiro Kosaka
G01 - MEASURING TESTING
Information
Patent Application
Method for Producing Superconducting Acceleration Cavity
Publication number
20070275860
Publication date
Nov 29, 2007
Katsuya Sennyu
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Particle detector and particle analyzer employing the same
Publication number
20030102220
Publication date
Jun 5, 2003
Takaaki Nagai
G01 - MEASURING TESTING