Koichi Sawahata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electro-static discharge protection device
- Patent number 7,875,902
- Issue date Jan 25, 2011
- Renesas Electronics Corporation
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electro-static discharge protection device
- Patent number 7,332,748
- Issue date Feb 19, 2008
- NEC Electronics Corporation
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS type semiconductor device having electrostatic discharge protec...
- Patent number 7,196,377
- Issue date Mar 27, 2007
- NEC Electronics Corporation
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multifinger-type electrostatic discharge protection element
- Patent number 7,098,510
- Issue date Aug 29, 2006
- NEC Electronics Corporation
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation simulation method
- Patent number 6,684,181
- Issue date Jan 27, 2004
- NEC Electronics Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having a protective circuit
- Patent number 6,624,479
- Issue date Sep 23, 2003
- NEC Electronics Corporation
- Koichi Sawahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation process simulation device realizing accurate inter...
- Patent number 5,999,719
- Issue date Dec 7, 1999
- NEC Corporation
- Susumu Asada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method capable of accurately simulating ion implantation at a high...
- Patent number 5,977,551
- Issue date Nov 2, 1999
- NEC Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus and computer program product for simulating ion i...
- Patent number 5,933,359
- Issue date Aug 3, 1999
- NEC Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation method for high resolution deep impurity profile
- Patent number 5,932,881
- Issue date Aug 3, 1999
- NEC Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion implantation simulation method
- Patent number 5,912,824
- Issue date Jun 15, 1999
- NEC Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for impurity distribution simulation
- Patent number 5,859,784
- Issue date Jan 12, 1999
- NEC Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for simulating ion implantation for performing si...
- Patent number 5,737,250
- Issue date Apr 7, 1998
- NEC Corporation
- Koichi Sawahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing light intensity distribution in projection sys...
- Patent number 5,502,654
- Issue date Mar 26, 1996
- NEC Corporation
- Koichi Sawahata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION DEVICE
- Publication number 20080277689
- Publication date Nov 13, 2008
- NEC Electronics Corporation
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS type semiconductor device having electrostatic discharge protec...
- Publication number 20050236672
- Publication date Oct 27, 2005
- NEC Electronics Corporation
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multifinger-type electrostatic discharge protection element
- Publication number 20050029540
- Publication date Feb 10, 2005
- NEC ELECTRONICS CORPORATION
- Noriyuki Kodama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electro-static discharge protection device
- Publication number 20040136127
- Publication date Jul 15, 2004
- Noriyuki Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a protective circuit
- Publication number 20010033003
- Publication date Oct 25, 2001
- Koichi Sawahata
- H01 - BASIC ELECTRIC ELEMENTS

Koichi Sawahata

Person

Patents Grantslast 30 patents

Electro-static discharge protection device

Electro-static discharge protection device

MOS type semiconductor device having electrostatic discharge protec...

Multifinger-type electrostatic discharge protection element

Ion implantation simulation method

Semiconductor device having a protective circuit

Ion implantation process simulation device realizing accurate inter...

Method capable of accurately simulating ion implantation at a high...

Method, apparatus and computer program product for simulating ion i...

Simulation method for high resolution deep impurity profile

Ion implantation simulation method

Method for impurity distribution simulation

Method and system for simulating ion implantation for performing si...

Method for analyzing light intensity distribution in projection sys...

Patents Applicationslast 30 patents

ELECTRO-STATIC DISCHARGE PROTECTION DEVICE

MOS type semiconductor device having electrostatic discharge protec...

Multifinger-type electrostatic discharge protection element

Electro-static discharge protection device

Semiconductor device having a protective circuit