Koichi Tamura

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring thickness and composition of mul...
- Patent number 6,885,727
- Issue date Apr 26, 2005
- SII NanoTechnology Inc.
- Koichi Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus
- Patent number 6,850,593
- Issue date Feb 1, 2005
- SII NanoTechnology Inc.
- Koichi Tamura
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Open chamber-type X-ray analysis apparatus
- Patent number 6,590,955
- Issue date Jul 8, 2003
- Seiko Instruments Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Slight amount sample analyzing apparatus
- Patent number 6,539,075
- Issue date Mar 25, 2003
- Seiko Instruments Inc.
- Koichi Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Portable X-ray fluorescence analyzer
- Patent number 6,486,573
- Issue date Nov 26, 2002
- Seiko Instruments Inc.
- Shigeki Yagi
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer
- Patent number 6,295,333
- Issue date Sep 25, 2001
- Seiko Instruments Inc.
- Koichi Tamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray coating thickness gauge
- Publication number 20030031294
- Publication date Feb 13, 2003
- Koichi Tamura
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence analysis apparatus
- Publication number 20010039137
- Publication date Nov 8, 2001
- Koichi Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Portable X-ray fluorescence analyzer
- Publication number 20010038248
- Publication date Nov 8, 2001
- Shigeki Yagi
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence analysis apparatus
- Publication number 20010039135
- Publication date Nov 8, 2001
- Koichi Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Open chamber-type X-ray analysis apparatus
- Publication number 20010028698
- Publication date Oct 11, 2001
- Yoshiki Matoba
- G01 - MEASURING TESTING