Koichi Terunuma

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Saku-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Narrow track CPP head with bias cancellation
- Patent number 7,675,718
- Issue date Mar 9, 2010
- Headway Technologies, Inc.
- Jei-Wei Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Process to manufacture narrow track CPP head with bias cancellation
- Patent number 7,506,430
- Issue date Mar 24, 2009
- Headway Technologies, Inc.
- Jei-Wei Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
GMR device having an improved free layer
- Patent number 7,477,491
- Issue date Jan 13, 2009
- Headway Technologies, Inc.
- Min Li
- G11 - INFORMATION STORAGE
Information Patent Grant
Process of manufacturing a narrow track CCP head with bias cancella...
- Patent number 7,134,184
- Issue date Nov 14, 2006
- Headway Technologies, Inc.
- Jei-Wei Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of adjusting CoFe free layer magnetostriction
- Patent number 6,998,150
- Issue date Feb 14, 2006
- Headway Technologies, Inc.
- Min Li
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Narrow track CPP head with bias cancellation
- Publication number 20070041124
- Publication date Feb 22, 2007
- Jei-Wei Chang
- G11 - INFORMATION STORAGE
Information Patent Application
Process to manufacture narrow track CPP head with bias cancellation
- Publication number 20070039166
- Publication date Feb 22, 2007
- Jei-Wei Chang
- G11 - INFORMATION STORAGE
Information Patent Application
Method of adjusting CoFe free layer magnetostriction
- Publication number 20060061919
- Publication date Mar 23, 2006
- HEADWAY TECHNOLOGIES, INC.
- Min Li
- G01 - MEASURING TESTING
Information Patent Application
Narrow track CPP head with bias cancellation
- Publication number 20050099739
- Publication date May 12, 2005
- HEADWAY TECHNOLOGIES, INC.
- Jei-Wei Chang
- G11 - INFORMATION STORAGE
Information Patent Application
Method of adjusting CoFe free layer magnetostriction
- Publication number 20040179311
- Publication date Sep 16, 2004
- HEADWAY TECHNOLOGIES, INC.
- Min Li
- G01 - MEASURING TESTING