Koichi Wada

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device for detecting fluid flow
- Patent number 11,209,098
- Issue date Dec 28, 2021
- Lube Corporation
- Koichi Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe and probe card
- Patent number 8,507,908
- Issue date Aug 13, 2013
- Advantest Corporation
- Koichi Wada
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe card
- Patent number 7,243,410
- Issue date Jul 17, 2007
- Advantest Corporation
- Koichi Wada
- G01 - MEASURING TESTING
Information Patent Grant
Video camera with an accessory adapter removably interposed between...
- Patent number 5,132,800
- Issue date Jul 21, 1992
- Sony Corporation
- Koichi Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Video camera carrying handle supporting battery and accessories
- Patent number 5,121,147
- Issue date Jun 9, 1992
- Sony Corporation
- Koichi Wada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR MANAGING FLOW-STATE OF FLUID
- Publication number 20190257443
- Publication date Aug 22, 2019
- LUBE CORPORATION
- Koichi WADA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
DEVICE FOR DETECTING FLUID FLOW
- Publication number 20190242495
- Publication date Aug 8, 2019
- LUBE CORPORATION
- Koichi WADA
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
PROBE, PROBE CARD, AND METHOD OF PRODUCTION OF PROBE
- Publication number 20100176396
- Publication date Jul 15, 2010
- Advantest Corporation
- Koichi Wada
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND PROBE CARD
- Publication number 20100176829
- Publication date Jul 15, 2010
- Advantest Corporation
- Koichi Wada
- G01 - MEASURING TESTING
Information Patent Application
Probe card, production method thereof and repairing method of probe...
- Publication number 20090039904
- Publication date Feb 12, 2009
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing a probe card
- Publication number 20040155009
- Publication date Aug 12, 2004
- Koichi Wada
- G01 - MEASURING TESTING