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Probe for measuring signals
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Patent number 6,271,673
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Issue date Aug 7, 2001
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Agilent Technologies, Inc.
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Masaji Furuta
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Balanced signal source
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Patent number 5,523,693
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Issue date Jun 4, 1996
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Hewlett-Packard Company
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Koichi Yanagawa
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G01 - MEASURING TESTING
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D.C. biasing apparatus
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Patent number 5,014,012
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Issue date May 7, 1991
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Hewlett-Packard Co.
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Yoichi Kuboyama
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G01 - MEASURING TESTING
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