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Koichi YATSUKA
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Gunma, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus synchronous module and synchronous method
Patent number
8,405,415
Issue date
Mar 26, 2013
Advantest Corporation
Satoshi Iwamoto
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus and test method
Patent number
7,906,981
Issue date
Mar 15, 2011
Advantest Corporation
Satoshi Iwamoto
G01 - MEASURING TESTING
Information
Patent Grant
Test equipment
Patent number
7,876,118
Issue date
Jan 25, 2011
Advantest Corporation
Satoshi Iwamoto
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus for testing an electronic device
Patent number
7,237,159
Issue date
Jun 26, 2007
Advantest Corporation
Koichi Yatsuka
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus
Patent number
7,142,003
Issue date
Nov 28, 2006
Advantest Corporation
Hironori Kanbayashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS SYNCHRONOUS MODULE AND SYNCHRONOUS METHOD
Publication number
20110057663
Publication date
Mar 10, 2011
Advantest Corporation
Satoshi IWAMOTO
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20110057673
Publication date
Mar 10, 2011
Advantest Corporation
Satoshi IWAMOTO
G01 - MEASURING TESTING
Information
Patent Application
TEST EQUIPMENT AND TEST METHOD
Publication number
20100194421
Publication date
Aug 5, 2010
Advantest Corporation
SATOSHI IWAMOTO
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND DEVICE INTERFACE
Publication number
20080133165
Publication date
Jun 5, 2008
Advantest Corporation
SATOSHI IWAMOTO
G01 - MEASURING TESTING
Information
Patent Application
Test apparatus
Publication number
20050278598
Publication date
Dec 15, 2005
Advantest Corporation
Koichi Yatsuka
G01 - MEASURING TESTING
Information
Patent Application
Test apparatus
Publication number
20050138505
Publication date
Jun 23, 2005
Advantest Corporation
Hironori Kanbayashi
G01 - MEASURING TESTING