Koichiro Takeuchi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Stage drive device
- Patent number 8,638,026
- Issue date Jan 28, 2014
- Hitachi High-Technologies Corporation
- Masashi Shibahara
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Scanning electron microscope
- Patent number 8,481,935
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope having time constant measurement capab...
- Patent number 8,274,048
- Issue date Sep 25, 2012
- Hitachi High-Technologies Corporation
- Akira Ikegami
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,989,768
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Akira Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample manufacturing method
- Patent number 7,928,377
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope having time constant measurement capab...
- Patent number 7,763,852
- Issue date Jul 27, 2010
- Hitachi High-Technologies Corporation
- Akira Ikegami
- G01 - MEASURING TESTING
Information Patent Grant
Electron lens and charged particle beam apparatus
- Patent number 7,759,652
- Issue date Jul 20, 2010
- Hitachi High-Technologies Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ION beam apparatus
- Patent number 7,550,740
- Issue date Jun 23, 2009
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus and focused ion beam irradiation method
- Patent number 7,411,192
- Issue date Aug 12, 2008
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20110278454
- Publication date Nov 17, 2011
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STAGE DRIVE DEVICE
- Publication number 20110260558
- Publication date Oct 27, 2011
- Masashi Shibahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope Having Time Constant Measurement Capab...
- Publication number 20100258723
- Publication date Oct 14, 2010
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20090039264
- Publication date Feb 12, 2009
- Hitachi High-Technologies Corporation
- Akira IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope Having Time Constant Measurement Capab...
- Publication number 20080116375
- Publication date May 22, 2008
- Hitachi High-Technologies Corporation
- Akira Ikegami
- G01 - MEASURING TESTING
Information Patent Application
Electron Lens and Charged Particle Beam Apparatus
- Publication number 20080067396
- Publication date Mar 20, 2008
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ION Beam Apparatus
- Publication number 20080023641
- Publication date Jan 31, 2008
- Hitachi High-Technologies Corporation
- Koichiro TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and sample manufacturing method
- Publication number 20060097166
- Publication date May 11, 2006
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam apparatus and focused ion beam irradiation method
- Publication number 20060022150
- Publication date Feb 2, 2006
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS

Koichiro Takeuchi

Person

Patents Grantslast 30 patents

Stage drive device

Scanning electron microscope

Scanning electron microscope having time constant measurement capab...

Scanning electron microscope

Charged particle beam apparatus and sample manufacturing method

Scanning electron microscope having time constant measurement capab...

Electron lens and charged particle beam apparatus

Focused ION beam apparatus

Focused ion beam apparatus and focused ion beam irradiation method

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPE

STAGE DRIVE DEVICE

Scanning Electron Microscope Having Time Constant Measurement Capab...

ELECTRON MICROSCOPE

Scanning Electron Microscope Having Time Constant Measurement Capab...

Electron Lens and Charged Particle Beam Apparatus

Focused ION Beam Apparatus

Charged particle beam apparatus and sample manufacturing method

Focused ion beam apparatus and focused ion beam irradiation method