Koichiro Tanaka

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Souraku-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Terahertz wave generation device and method for generating terahert...
- Patent number 8,497,490
- Issue date Jul 30, 2013
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G02 - OPTICS
Information Patent Grant
Reflection type terahertz spectrometer and spectrometric method
- Patent number 7,488,940
- Issue date Feb 10, 2009
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channeled measuring method and apparatus for measuring spectr...
- Patent number 7,221,451
- Issue date May 22, 2007
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor crystal for generating terahertz waves, terahertz wav...
- Patent number 7,177,071
- Issue date Feb 13, 2007
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ WAVE GENERATION DEVICE AND METHOD FOR GENERATING TERAHERT...
- Publication number 20110147621
- Publication date Jun 23, 2011
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G02 - OPTICS
Information Patent Application
TERAHERTZ WAVE GENERATING APPARATUS AND TERAHERTZ WAVE GENERATING M...
- Publication number 20100054296
- Publication date Mar 4, 2010
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki OHTAKE
- G02 - OPTICS
Information Patent Application
Reflection type terahertz spectrometer and spectrometric method
- Publication number 20060231762
- Publication date Oct 19, 2006
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor crystal for generating terahertz waves, terahertz wav...
- Publication number 20050258368
- Publication date Nov 24, 2005
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G02 - OPTICS
Information Patent Application
Multi-channeled measuring method and apparatus for measuring spectr...
- Publication number 20050179905
- Publication date Aug 18, 2005
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING