Koichiro YANO

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Matsumoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Positioning method, positioning device, and program
- Patent number 8,339,310
- Issue date Dec 25, 2012
- Seiko Epson Corporation
- Shunichi Mizuochi
- G01 - MEASURING TESTING
Information Patent Grant
Positioning method, program, positioning device, and electronic app...
- Patent number 7,965,229
- Issue date Jun 21, 2011
- Seiko Epson Corporation
- Shunichi Mizuochi
- G01 - MEASURING TESTING
Information Patent Grant
Positioning method, positioning device, and program
- Patent number 7,777,673
- Issue date Aug 17, 2010
- Seiko Epson Corporation
- Shunichi Mizuochi
- G01 - MEASURING TESTING
Information Patent Grant
Method of acquiring error correction value of reference frequency,...
- Patent number 7,741,995
- Issue date Jun 22, 2010
- Seiko Epson Corporation
- Hidekazu Maezawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POSITIONING METHOD, POSITIONING DEVICE, AND PROGRAM
- Publication number 20100280780
- Publication date Nov 4, 2010
- SEIKO EPSON CORPORATION
- Shunichi MIZUOCHI
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING METHOD, POSITIONING DEVICE, AND PROGRAM
- Publication number 20090140924
- Publication date Jun 4, 2009
- SEIKO EPSON CORPORATION
- Shunichi MIZUOCHI
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING METHOD, PROGRAM, POSITIONING DEVICE, AND ELECTRONIC APP...
- Publication number 20090096670
- Publication date Apr 16, 2009
- SEIKO EPSON CORPORATION
- Shunichi MIZUOCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ACQUIRING ERROR CORRECTION VALUE OF REFERENCE FREQUENCY,...
- Publication number 20080068258
- Publication date Mar 20, 2008
- SEIKO EPSON CORPORATION
- Hidekazu MAEZAWA
- G01 - MEASURING TESTING
Information Patent Application
Positioning device, method of controlling positioning device, progr...
- Publication number 20070203647
- Publication date Aug 30, 2007
- SEIKO EPSON CORPORATION
- Shunichi Mizuochi
- G01 - MEASURING TESTING