Koji Asami

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus of antenna array
- Patent number 11,789,055
- Issue date Oct 17, 2023
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Calibration device, conversion device, calibration method, and non-...
- Patent number 11,784,729
- Issue date Oct 10, 2023
- Advantest Corporation
- Koji Asami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Calibration device, conversion device, calibration method, and comp...
- Patent number 11,290,197
- Issue date Mar 29, 2022
- Advantest Corporation
- Koji Asami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Front-end circuit
- Patent number 11,258,521
- Issue date Feb 22, 2022
- Advantest Corporation
- Koji Asami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement apparatus, program, recording medium, and measurement m...
- Patent number 8,706,445
- Issue date Apr 22, 2014
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal processing apparatus, digital filter and recording medium
- Patent number 8,572,145
- Issue date Oct 29, 2013
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus and test method for A/D converter
- Patent number 8,525,714
- Issue date Sep 3, 2013
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-digital converting method and analog-digital converting appa...
- Patent number 8,519,872
- Issue date Aug 27, 2013
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal processing apparatus, test system, distortion detecting appa...
- Patent number 8,358,682
- Issue date Jan 22, 2013
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Distortion identification apparatus, test system, recording medium...
- Patent number 8,290,032
- Issue date Oct 16, 2012
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, recording medium, and test a...
- Patent number 8,090,011
- Issue date Jan 3, 2012
- Advantest Corporation
- Koji Asami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing apparatus and testing method
- Patent number 7,960,995
- Issue date Jun 14, 2011
- Advantest Corporation
- Koji Asami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Analog digital converting apparatus, analog digital converting meth...
- Patent number 7,880,649
- Issue date Feb 1, 2011
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog digital convert apparatus, analog digital convert method, co...
- Patent number 7,821,432
- Issue date Oct 26, 2010
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog to digital converter and recording medium
- Patent number 7,609,183
- Issue date Oct 27, 2009
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog/digital converter and program therefor
- Patent number 7,471,221
- Issue date Dec 30, 2008
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digitizer module, a waveform generating module, a converting method...
- Patent number 7,385,542
- Issue date Jun 10, 2008
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digitizer module, a waveform generating module, a converting method...
- Patent number 7,385,546
- Issue date Jun 10, 2008
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog/digital converter and program therefor
- Patent number 7,292,166
- Issue date Nov 6, 2007
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay amount measurement method
- Patent number 7,197,413
- Issue date Mar 27, 2007
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system
- Patent number 7,173,443
- Issue date Feb 6, 2007
- Advantest Corp.
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Analog digital converter and program therefor
- Patent number 7,119,724
- Issue date Oct 10, 2006
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for converting A/D, and an A/D converting apparatus
- Patent number 7,106,236
- Issue date Sep 12, 2006
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digitizer module, a waveform generating module, a converting method...
- Patent number 6,867,719
- Issue date Mar 15, 2005
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digitizer module, a waveform generating module, a converting method...
- Patent number 6,836,227
- Issue date Dec 28, 2004
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Interleaving AD conversion type waveform digitizer
- Patent number 6,836,235
- Issue date Dec 28, 2004
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Interleaving A/D conversion type waveform digitizer module and a te...
- Patent number 6,809,668
- Issue date Oct 26, 2004
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Interleaving A/D conversion type waveform digitizer module and a te...
- Patent number 6,801,145
- Issue date Oct 5, 2004
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Digitizer apparatus and semiconductor testing apparatus
- Patent number 6,700,515
- Issue date Mar 2, 2004
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Grant
Test device and method for electrically testing electronic device
- Patent number 6,687,868
- Issue date Feb 3, 2004
- Advantest Corporation
- Yasuo Furukawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL GENERATOR
- Publication number 20240022270
- Publication date Jan 18, 2024
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CALIBRATION DEVICE, CONVERSION DEVICE, CALIBRATION METHOD, AND NON-...
- Publication number 20230105908
- Publication date Apr 6, 2023
- Advantest Corporation
- Koji ASAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS OF ANTENNA ARRAY
- Publication number 20220326290
- Publication date Oct 13, 2022
- Advantest Corporation
- Koji ASAMI
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION DEVICE, CONVERSION DEVICE, CALIBRATION METHOD, AND COMP...
- Publication number 20210336710
- Publication date Oct 28, 2021
- Advantest Corporation
- Koji ASAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FRONT-END CIRCUIT
- Publication number 20200412458
- Publication date Dec 31, 2020
- Advantest Corporation
- Koji ASAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM
- Publication number 20130238262
- Publication date Sep 12, 2013
- Advantest Corporation
- Koji ASAMI
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD FOR A/D CONVERTER
- Publication number 20120229314
- Publication date Sep 13, 2012
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG-DIGITAL CONVERTING METHOD AND ANALOG-DIGITAL CONVERTING APPA...
- Publication number 20120176260
- Publication date Jul 12, 2012
- Advantest Corporation
- Koji ASAMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD AND RECORDING MEDIUM
- Publication number 20120109548
- Publication date May 3, 2012
- Advantest Corporation
- Koji ASAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD AND RECORDING MEDIUM
- Publication number 20110222592
- Publication date Sep 15, 2011
- Advantest Corporation
- Koji ASAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT APPARATUS, PROGRAM, RECORDING MEDIUM, AND MEASUREMENT M...
- Publication number 20110022341
- Publication date Jan 27, 2011
- Advantest Corporation
- Koji ASAMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Signal processing apparatus, test system, distortion detecting appa...
- Publication number 20100310006
- Publication date Dec 9, 2010
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Application
Distortion identification apparatus, test system, recording medium...
- Publication number 20100309952
- Publication date Dec 9, 2010
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING APPARATUS, DIGITAL FILTER AND RECORDING MEDIUM
- Publication number 20100250638
- Publication date Sep 30, 2010
- Advantest Corporation
- Koji ASAMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG DIGITAL CONVERT APPARATUS, ANALOG DIGITAL CONVERT METHOD, CO...
- Publication number 20100060495
- Publication date Mar 11, 2010
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG DIGITAL CONVERTING APPARATUS, ANALOG DIGITAL CONVERTING METH...
- Publication number 20090273495
- Publication date Nov 5, 2009
- Advantest Corporation
- Koji ASAMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASURING APPARATUS, MEASURING METHOD, RECORDING MEDIUM, AND TEST A...
- Publication number 20090180527
- Publication date Jul 16, 2009
- Advantest Corporation
- Koji Asami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS, SKEW MEASURING APPARATUS, DEVICE AND BOARD
- Publication number 20090105977
- Publication date Apr 23, 2009
- Advantest Corporation
- YASUO FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20090043528
- Publication date Feb 12, 2009
- Advantest Corporation
- KOJI ASAMI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ANALOG TO DIGITAL CONVERTER AND RECORDING MEDIUM
- Publication number 20080272942
- Publication date Nov 6, 2008
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
WAVEFORM CONVERTING APPARATUS, WAVEFORM CONVERTING METHOD TEST APPA...
- Publication number 20070236227
- Publication date Oct 11, 2007
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG/DIGITAL CONVERTER AND PROGRAM THEREFOR
- Publication number 20060267813
- Publication date Nov 30, 2006
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analog/digital converter and program therefor
- Publication number 20060267814
- Publication date Nov 30, 2006
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Delay amount measurement method
- Publication number 20060161383
- Publication date Jul 20, 2006
- Advantest Corporation
- Koji Asami
- G01 - MEASURING TESTING
Information Patent Application
Method for converting A/D, and an A/D converting apparatus
- Publication number 20050270213
- Publication date Dec 8, 2005
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Transformer, transforming apparatus, transforming method and machin...
- Publication number 20050141642
- Publication date Jun 30, 2005
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIGITIZER MODULE, A WAVEFORM GENERATING MODULE, A CONVERTING METHOD...
- Publication number 20050024244
- Publication date Feb 3, 2005
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Digitizer module, a waveform generating module, a converting method...
- Publication number 20050017886
- Publication date Jan 27, 2005
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Digitizer module, a waveform generating module, a converting method...
- Publication number 20050017885
- Publication date Jan 27, 2005
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Digitizer module, a waveform generating module, a converting method...
- Publication number 20040164889
- Publication date Aug 26, 2004
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Test apparatus of antenna array

Calibration device, conversion device, calibration method, and non-...

Calibration device, conversion device, calibration method, and comp...

Front-end circuit

Measurement apparatus, program, recording medium, and measurement m...

Signal processing apparatus, digital filter and recording medium

Test apparatus and test method for A/D converter

Analog-digital converting method and analog-digital converting appa...

Signal processing apparatus, test system, distortion detecting appa...

Distortion identification apparatus, test system, recording medium...

Measuring apparatus, measuring method, recording medium, and test a...

Testing apparatus and testing method

Analog digital converting apparatus, analog digital converting meth...

Analog digital convert apparatus, analog digital convert method, co...

Analog to digital converter and recording medium

Analog/digital converter and program therefor

Digitizer module, a waveform generating module, a converting method...

Digitizer module, a waveform generating module, a converting method...

Analog/digital converter and program therefor

Delay amount measurement method

Semiconductor test system

Analog digital converter and program therefor

Method for converting A/D, and an A/D converting apparatus

Digitizer module, a waveform generating module, a converting method...

Digitizer module, a waveform generating module, a converting method...

Interleaving AD conversion type waveform digitizer

Interleaving A/D conversion type waveform digitizer module and a te...

Interleaving A/D conversion type waveform digitizer module and a te...

Digitizer apparatus and semiconductor testing apparatus

Test device and method for electrically testing electronic device

Patents Applicationslast 30 patents

SIGNAL GENERATOR

CALIBRATION DEVICE, CONVERSION DEVICE, CALIBRATION METHOD, AND NON-...

TEST APPARATUS OF ANTENNA ARRAY

CALIBRATION DEVICE, CONVERSION DEVICE, CALIBRATION METHOD, AND COMP...

FRONT-END CIRCUIT

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM

TEST APPARATUS AND TEST METHOD FOR A/D CONVERTER

ANALOG-DIGITAL CONVERTING METHOD AND ANALOG-DIGITAL CONVERTING APPA...

MEASUREMENT APPARATUS, MEASUREMENT METHOD AND RECORDING MEDIUM

MEASUREMENT APPARATUS, MEASUREMENT METHOD AND RECORDING MEDIUM

MEASUREMENT APPARATUS, PROGRAM, RECORDING MEDIUM, AND MEASUREMENT M...

Signal processing apparatus, test system, distortion detecting appa...

Distortion identification apparatus, test system, recording medium...

SIGNAL PROCESSING APPARATUS, DIGITAL FILTER AND RECORDING MEDIUM

ANALOG DIGITAL CONVERT APPARATUS, ANALOG DIGITAL CONVERT METHOD, CO...

ANALOG DIGITAL CONVERTING APPARATUS, ANALOG DIGITAL CONVERTING METH...

MEASURING APPARATUS, MEASURING METHOD, RECORDING MEDIUM, AND TEST A...

TEST APPARATUS, SKEW MEASURING APPARATUS, DEVICE AND BOARD

TESTING APPARATUS AND TESTING METHOD

ANALOG TO DIGITAL CONVERTER AND RECORDING MEDIUM

WAVEFORM CONVERTING APPARATUS, WAVEFORM CONVERTING METHOD TEST APPA...

ANALOG/DIGITAL CONVERTER AND PROGRAM THEREFOR

Analog/digital converter and program therefor

Delay amount measurement method

Method for converting A/D, and an A/D converting apparatus

Transformer, transforming apparatus, transforming method and machin...

DIGITIZER MODULE, A WAVEFORM GENERATING MODULE, A CONVERTING METHOD...

Digitizer module, a waveform generating module, a converting method...

Digitizer module, a waveform generating module, a converting method...

Digitizer module, a waveform generating module, a converting method...