Koji Eguchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Factory layout
- Patent number 6,748,704
- Issue date Jun 15, 2004
- Renesas Technology Corp.
- Koji Eguchi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Clean room having an escalator, and method of transporting a semico...
- Patent number 6,705,450
- Issue date Mar 16, 2004
- Renesas Technology Corp.
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control device and process control method using a medium wi...
- Patent number 6,595,428
- Issue date Jul 22, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Prober and electric evaluation method of semiconductor device
- Patent number 6,194,907
- Issue date Feb 27, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tsuyoshi Kanao
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a metal interconnect with high resistance t...
- Patent number 5,466,638
- Issue date Nov 14, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including semiconductor layer having impurity...
- Patent number 5,446,301
- Issue date Aug 29, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilayer conductive wire for semiconductor device and manufacturi...
- Patent number 5,444,186
- Issue date Aug 22, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including semiconductor layer having impurity...
- Patent number 5,381,029
- Issue date Jan 10, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromigration resistance metal interconnect
- Patent number 5,373,192
- Issue date Dec 13, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring connection structure for a semiconductor integrated circuit...
- Patent number 5,200,807
- Issue date Apr 6, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a trench capacitor for dram
- Patent number 4,859,622
- Issue date Aug 22, 1989
- Matsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 4,849,854
- Issue date Jul 18, 1989
- Mitsubihsi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Distribution management system, distribution management method, and...
- Publication number 20030046192
- Publication date Mar 6, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Factory layout
- Publication number 20020046518
- Publication date Apr 25, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- E04 - BUILDING
Information Patent Application
Process control device and process control method using a medium wi...
- Publication number 20020008136
- Publication date Jan 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clean room having an escalator, and method of transporting a semico...
- Publication number 20020008005
- Publication date Jan 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Product control method using wireless communication
- Publication number 20020002409
- Publication date Jan 3, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Koji Eguchi
- G05 - CONTROLLING REGULATING

Koji Eguchi

Person

Patents Grantslast 30 patents

Factory layout

Clean room having an escalator, and method of transporting a semico...

Process control device and process control method using a medium wi...

Prober and electric evaluation method of semiconductor device

Method of manufacturing a metal interconnect with high resistance t...

Semiconductor device including semiconductor layer having impurity...

Multilayer conductive wire for semiconductor device and manufacturi...

Semiconductor device including semiconductor layer having impurity...

Electromigration resistance metal interconnect

Wiring connection structure for a semiconductor integrated circuit...

Method of making a trench capacitor for dram

Semiconductor device and method of manufacturing the same

Patents Applicationslast 30 patents

Distribution management system, distribution management method, and...

Factory layout

Process control device and process control method using a medium wi...

Clean room having an escalator, and method of transporting a semico...

Product control method using wireless communication